Predictors of Electrical Abnormalities Related to Mechanical Trauma during Transcatheter Aortic Valve Implantation

Background: When it came to treating patients with severe symptomatic aortic stenosis (AS) who are at high or prohibitive surgical risk, transcatheter aortic valve implantation (TAVI) marked a paradigm change. TAVI has become a safe technique with predictable results as a result of the expanding expertise in this sector, which has also reduced the risk of problems over time and increased the use of a minimalist approach. The incidence of conduction disturbances, such as bundle branch blocks or atrioventricular blocks necessitating pacemaker implantation, has not decreased recently, in contrast to other procedural complications. Methods: This observational study included 80 patients with symptomatic severe AS who underwent transfemoral TAVI. Patients were divided based on the development of post-TAVI conduction abnormalities into two groups. Group I (n=70) without conduction abnormalities and group II (n = 10) developed new-onset conduction abnormalities. Results: Depth of implantation at the membranous septum (DIMS) revealed a significant AUC of 0.935 with a 95% confidence interval ranging from 0.866 to 1.000, suggesting an excellent ability to predict conduction abnormalities. The best cutoff was > 64 mm, at which sensitivity, specificity, PPV, and NPV were 90.0%, 87.14%, 50.0%, and 98.4% respectively. ΔMSID demonstrated a significant AUC of 0.936 with a 95% confidence interval ranging from 0.838 to 1.000, indicating excellent predictive ability. The best cutoff point was ≤2 mm, at which sensitivity, specificity, PPV, and NPV were 80.0%, 98.57%, 88.9%, and 97.2% respectively. Conclusions: Conduction disturbances remain a common complication of TAVI. Presence of RBBB is a risk factor that increases patient propensity for developing such complications post TAVI. The relationship between depth of implantation and membranous septum is a strong independent procedural predictor and prospective validation of its cut-offs is needed.

Publication Details

Journal
The Egyptian Journal of Hospital Medicine
Published
2025-10-01
DOI
https://doi.org/10.21608/ejhm.2025.467335
Primary Topic
Cardiac Valve Diseases and Treatments
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Predictors of Electrical Abnormalities Related to Mechanical Trauma during Transcatheter Aortic Valve Implantation

The Egyptian Journal of Hospital Medicine
Cardiac Valve Diseases and Treatments
article

Predictors of Electrical Abnormalities Related to Mechanical Trauma during Transcatheter Aortic Valve Implantation

article en

Abstract

Background: When it came to treating patients with severe symptomatic aortic stenosis (AS) who are at high or prohibitive surgical risk, transcatheter aortic valve implantation (TAVI) marked a paradigm change. TAVI has become a safe technique with predictable results as a result of the expanding expertise in this sector, which has also reduced the risk of problems over time and increased the use of a minimalist approach. The incidence of conduction disturbances, such as bundle branch blocks or atrioventricular blocks necessitating pacemaker implantation, has not decreased recently, in contrast to other procedural complications. Methods: This observational study included 80 patients with symptomatic severe AS who underwent transfemoral TAVI. Patients were divided based on the development of post-TAVI conduction abnormalities into two groups. Group I (n=70) without conduction abnormalities and group II (n = 10) developed new-onset conduction abnormalities. Results: Depth of implantation at the membranous septum (DIMS) revealed a significant AUC of 0.935 with a 95% confidence interval ranging from 0.866 to 1.000, suggesting an excellent ability to predict conduction abnormalities. The best cutoff was > 64 mm, at which sensitivity, specificity, PPV, and NPV were 90.0%, 87.14%, 50.0%, and 98.4% respectively. ΔMSID demonstrated a significant AUC of 0.936 with a 95% confidence interval ranging from 0.838 to 1.000, indicating excellent predictive ability. The best cutoff point was ≤2 mm, at which sensitivity, specificity, PPV, and NPV were 80.0%, 98.57%, 88.9%, and 97.2% respectively. Conclusions: Conduction disturbances remain a common complication of TAVI. Presence of RBBB is a risk factor that increases patient propensity for developing such complications post TAVI. The relationship between depth of implantation and membranous septum is a strong independent procedural predictor and prospective validation of its cut-offs is needed.

The Egyptian Journal of Hospital MedicineVol. 101(1)
Openalex Percentile: Top 45%
Cardiac Valve Diseases and Treatments
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

Predictors of Electrical Abnormalities Related to Mechanical Trauma during Transcatheter Aortic Valve Implantation · The Egyptian Journal of Hospital Medicine (2025) | TGRS Research Map | TGRS