SSKD: self-supervised knowledge distillation for reliable remote surface defect detection under wireless transmission attenuation
Abstract Wireless sensor networks (WSNs) enable scalable, remote surface-defect inspection in smart manufacturing, but attenuation during wireless image transmission—manifesting as noise, compression artifacts, and packet loss—undermines diagnostic reliability. Existing solutions often assume high-fidelity inputs, rely on large paired datasets of pristine and degraded images, or require costly hardware upgrades, and they degrade sharply under adverse channel conditions. We propose a Self-Supervised Knowledge Distillation (SSKD) framework that reconstructs attenuated observations on the fly without historical pairings or rigid data correlations, avoiding hardware changes. SSKD couples a self-supervised learning architecture with cross-domain knowledge transfer to autonomously restore defect-salient cues and stabilize downstream detection. Across diverse attenuation scenarios and domains (including Ball Screw Drive monitoring), experiments show that SSKD consistently preserves diagnostic fidelity and robustness relative to strong baselines under severe degradation, enabling reliable remote inspection with commodity WSN deployments.
Authors
- Qingsheng Wei (ORCID: https://orcid.org/0009-0002-9933-8222)
- Hai Jiang (ORCID: https://orcid.org/0000-0003-1042-4897)
- Renpu Li
- Junyu Qi (ORCID: https://orcid.org/0000-0003-1669-8987)
- Chengcheng Guo (ORCID: https://orcid.org/0000-0003-0857-0350)
- Peng Chen (ORCID: https://orcid.org/0000-0002-3265-3079)
- Jie Ma (ORCID: https://orcid.org/0000-0003-1996-5163)
- Dong Wu (ORCID: https://orcid.org/0000-0001-7864-4031)
Institutions
- Shantou University (CN)
- Changzhou Vocational Institute of Light Industry (CN)
- Guangdong Institute of Intelligent Manufacturing (CN)
- Changzhou Vocational Institute of Engineering (CN)
- Jiangsu University of Technology (CN)
- Reutlingen University (DE)
Publication Details
- Journal
- Engineering Research Express
- Published
- 2025-11-28
- DOI
- https://doi.org/10.1088/2631-8695/ae25ba
- Primary Topic
- Advanced Neural Network Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00