SPOT IP Faults: Identifying Intermittent and Parametric Faults in Analog Circuits via Beluga Whale Optimization Driven Graph Attention Capsule Network

Analog circuits within the core of electronic systems can introduce faults in the Circuit Under Test (CUT), which may lead to malfunction or even catastrophic failures. The intermittent and parametric faults are also quite hard to observe because of their random nature and non-reproducibility. In this research, a novel SPOT-IP fault detection model has been proposed to enhance the reliability and safety of an electronic system in the event of analog circuits. Initially, the Equispaced curvelet transform(N-ECT) is used to extract spectral, statistical characteristics from gathered signals containing the frequency response to enhance the localization of features. The proposed method utilizes a Graph Attention Capsule Neural Network (GACNN) that is used to categorize analog circuits as fault-free, parametric fault, and intermittent fault, using extracted features. Additionally, the hyperparameters of the GACNN are optimized using Beluga Whale Optimization to improve detection accuracy. The simulation was validated by the two filters, namely the Sallen-Key bypass filter (SK-BPF), and a Tow-Thomas filter (TTF), and the proposed method is evaluated using accuracy, sensitivity and computational time. The proposed technique exhibits better accuracy for intermittent fault (99.12%) and parametric fault (99.25%) detection which is high compared to the existing techniques.

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Publication Details

Journal
Journal of Circuits Systems and Computers
Published
2025-11-28
DOI
https://doi.org/10.1142/s0218126626500520
Primary Topic
VLSI and Analog Circuit Testing
Type
article
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article

SPOT IP Faults: Identifying Intermittent and Parametric Faults in Analog Circuits via Beluga Whale Optimization Driven Graph Attention Capsule Network

S. Kanthalakshmi, D Archana
Journal of Circuits Systems and Computers
VLSI and Analog Circuit Testing
article

SPOT IP Faults: Identifying Intermittent and Parametric Faults in Analog Circuits via Beluga Whale Optimization Driven Graph Attention Capsule Network

S. Kanthalakshmi, D Archana
article en

Abstract

Analog circuits within the core of electronic systems can introduce faults in the Circuit Under Test (CUT), which may lead to malfunction or even catastrophic failures. The intermittent and parametric faults are also quite hard to observe because of their random nature and non-reproducibility. In this research, a novel SPOT-IP fault detection model has been proposed to enhance the reliability and safety of an electronic system in the event of analog circuits. Initially, the Equispaced curvelet transform(N-ECT) is used to extract spectral, statistical characteristics from gathered signals containing the frequency response to enhance the localization of features. The proposed method utilizes a Graph Attention Capsule Neural Network (GACNN) that is used to categorize analog circuits as fault-free, parametric fault, and intermittent fault, using extracted features. Additionally, the hyperparameters of the GACNN are optimized using Beluga Whale Optimization to improve detection accuracy. The simulation was validated by the two filters, namely the Sallen-Key bypass filter (SK-BPF), and a Tow-Thomas filter (TTF), and the proposed method is evaluated using accuracy, sensitivity and computational time. The proposed technique exhibits better accuracy for intermittent fault (99.12%) and parametric fault (99.25%) detection which is high compared to the existing techniques.

Journal of Circuits Systems and Computers
PSG INSTITUTE OF TECHNOLOGY AND APPLIED RESEARCH (IN)
Openalex Percentile: Top 59%
VLSI and Analog Circuit Testing
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SPOT IP Faults: Identifying Intermittent and Parametric Faults in Analog Circuits via Beluga Whale Optimization Driven Graph Attention Capsule Network — S. Kanthalakshmi, D Archana · Journal of Circuits Systems and Computers (2025) | TGRS Research Map | TGRS