European Test Symposium Teams: an Anniversary Snapshot

The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team’s section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.

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Publication Details

Published
2025-05-26
DOI
https://doi.org/10.1109/ets63895.2025.11049652
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00
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article

European Test Symposium Teams: an Anniversary Snapshot

Petru Eles, Zebo Peng, Miloš Krstić, Patrick Girard et al.
VLSI and Analog Circuit Testing
article

European Test Symposium Teams: an Anniversary Snapshot

Petru Eles, Zebo Peng, Miloš Krstić, Patrick Girard, Michael A. Skitsas, Said Hamdioui, Zainalabedin Navabi, Görschwin Fey, Hans-Joachim Wunderlich, Jaan Raik, Kwondo Ma, Raimund Ubar, Flavio Vella, Moritz Fieback, Po-Yao Chuang, Anthony Coyette, V.A. Vardanian, Stavros Hadjitheophanous, Anteneh Gebregiorgis, Zahra Jahanpeima, Paolo Maistri, Maryam Rajabalipanah, Stefano Di Carlo, Chandramouli Amarnath, Wim Dobbelaere, Georges Gielen, Anurup Saha, Marko Andjelković, G. Harutyunyan, S. Shoukourian, Jennifer Dworak, Erik Jan Marinissen, Nooshin Nosrati, Mahta Mayahinia, Fernando Fernandes dos Santos, Paolo Bernardi, L. M. Bolzani Poehls, Sybille Hellebrand, Iulia Ștefan, Paolo Rech, Fabian Vargas, M. Sonza Reorda, Angeliki Kritikakou, Artur Jutman, Maksim Jenihhin, Daniel Tille, Alberto Bosio, Salvador Mir, Ronny Vanhooren, Maria K. Michael, Mehdi B. Tahoori, Andreas Glowatz, Kyriakos Christou, Abhijit Chatterjee, Cosmina Corches, Paolo Prinetto, Elena Ioana Vatajelu, Rolf Drechsler, Szilárd Enyedi, Liviu Cristian Miclea, Stephan Eggersglüß, Stelios Neophytou, Ovidiu Stan, Marcello Traiola, Kundan Nepal, Manuel J. Barragán, Grigor Tshagharyan, M. Violante, Katayoon Basharkhah, A. Virazel, Theodore W. Manikas, Marzio Vallero, Motta Taouil, Rajendra Bishnoi, Giorgio Di Natale, Bastien Deveautour, Y. Zorian, Haralampos Stratigopoulos, Giulia Casagranda, Sri Gowri Komarraju, Natalia Cherezova
article en

Abstract

The IEEE European Test Symposium (ETS) has been facilitating progress in electronic systems testing since its launch in 1996. On the occasion of its 30th anniversary, this collaborative paper gathers sections by 21 ETS teams to outline their influential ideas and milestones. Each team’s section highlights historical perspective, current research, frameworks and projects as well as forward-looking research agendas in the area of electronic-based circuits and systems testing, reliability, safety, security and validation. This anniversary summary documents how research of various ETS teams, exemplifying the test community, has been evolving and transitioning from concepts to practical standards and Electronic Design Automation (EDA) tools and flows. This legacy is a strong base to drive the next generation of advances in electronic systems testing.

Karlsruhe Institute of Technology (DE), Institut polytechnique de Grenoble (FR), Tallinn University of Technology (EE), Centre National de la Recherche Scientifique (FR), Synopsys (Switzerland) (CH), Technical University of Cluj-Napoca (RO), University of Nicosia (CY), Politecnico di Torino (IT), University of Trento (IT), University of Tehran (IR), University of Cyprus (CY), Sorbonne Université (FR), IMEC (BE), Embedded Systems (United States) (US), Université Grenoble Alpes (FR), Delft University of Technology (NL)
Openalex Percentile: Top 59%
VLSI and Analog Circuit Testing
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