Modeling and Design Automation of Fault-Tolerant Digitally Controlled Ring Oscillators

Accurate modeling of Digitally Controlled Ring Oscillators (DCROs) is crucial for optimizing their performance in Phase-Locked Loops (PLLs) and other high-speed applications. This paper presents a systematic approach to model the frequency and power characteristics of Resistively Decoupled Unit Cell (RDUC)-based DCROs, using an Elmore delay model with nonlinear characterization of RDUC delays. The proposed method efficiently characterizes key parameters, enabling DCRO design automation. Additionally, the RDUC architecture improves radiation hardness, making it ideal for harsh environment applications. This computationally efficient approach enables rapid simulation, significantly reducing design time. The model's accuracy is validated through experimental results on a 65 nm CMOS test chip.

Authors

Institutions

Publication Details

Published
2025-08-10
DOI
https://doi.org/10.1109/mwscas53549.2025.11244567
Primary Topic
Advancements in PLL and VCO Technologies
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Modeling and Design Automation of Fault-Tolerant Digitally Controlled Ring Oscillators

Jeffrey Prinzie, Stefan Biereigel, E. Tackx, Venkata Sathyajith Kampati
Advancements in PLL and VCO Technologies
article

Modeling and Design Automation of Fault-Tolerant Digitally Controlled Ring Oscillators

Jeffrey Prinzie, Stefan Biereigel, E. Tackx, Venkata Sathyajith Kampati
article en

Abstract

Accurate modeling of Digitally Controlled Ring Oscillators (DCROs) is crucial for optimizing their performance in Phase-Locked Loops (PLLs) and other high-speed applications. This paper presents a systematic approach to model the frequency and power characteristics of Resistively Decoupled Unit Cell (RDUC)-based DCROs, using an Elmore delay model with nonlinear characterization of RDUC delays. The proposed method efficiently characterizes key parameters, enabling DCRO design automation. Additionally, the RDUC architecture improves radiation hardness, making it ideal for harsh environment applications. This computationally efficient approach enables rapid simulation, significantly reducing design time. The model's accuracy is validated through experimental results on a 65 nm CMOS test chip.

European Organization for Nuclear Research (CH), Materialise (Belgium) (BE)
Openalex Percentile: Top 63%
Advancements in PLL and VCO Technologies
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.