Error-mitigated quantum metrology via enhanced virtual purification

Abstract Quantum metrology stands as a leading application of quantum science and technology, yet noise often constrains its precision and sensitivity. In near-term quantum metrology, existing protocols largely depend on virtual state purification, but significant noise accumulation and additional noise from the implementations of these protocols can impede their effectiveness. We propose enhanced virtual channel purification to address these problems, yielding enhanced virtual state purification as a by-product. Within sequential quantum metrology schemes, our error analysis reveals substantial bias reduction and quantum advantages in sampling cost when the number of encoding channels is $${\mathcal{O}}({p}^{-1})$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mi>O</mml:mi> <mml:mrow> <mml:mo>(</mml:mo> <mml:mrow> <mml:msup> <mml:mrow> <mml:mi>p</mml:mi> </mml:mrow> <mml:mrow> <mml:mo>−</mml:mo> <mml:mn>1</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> <mml:mo>)</mml:mo> </mml:mrow> </mml:math> , where p represents the error rate of encoding channels. In this range, our methods demonstrate significant improvements in parameter estimation precision and robustness against practical noise, as evidenced by numerical simulations for both single- and multi-parameter tasks. Particularly, these methods can naturally extend beyond quantum metrology, indicating their broad applicability in quantum information and quantum computation.