KherveFitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data

ABSTRACT KherveFitting is a software written in Python and designed for fitting X‐ray photoelectron spectroscopy (XPS) data. It provides a user‐friendly graphical interface for researchers in materials science and surface analysis, offering features that include multiple background subtraction methods, various peak fitting models, and automated multipeak fitting with customisable constraints. This software aims to fill a gap in the market for XPS analysis tools, providing a freely available solution for users. This paper describes the software architecture and its theoretical background, including fitting algorithms and peak models. Its performance is validated by directly comparing quantification accuracy and peak fitting capabilities against established commercial software packages, demonstrating robust and reliable results across diverse test cases including ionic liquids, conducting oxides, and rare earth materials.

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Publication Details

Journal
Surface and Interface Analysis
Published
2025-11-24
DOI
https://doi.org/10.1002/sia.70032
Citations
4
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
2.64

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article

KherveFitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data

Benjamen P. Reed, William S. J. Skinner, David J. Payne, David Morgan et al.
4 citations
Surface and Interface Analysis
Electron and X-Ray Spectroscopy Techniques
2.64
article

KherveFitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data

Benjamen P. Reed, William S. J. Skinner, David J. Payne, David Morgan, Julian Andreas Hochhaus, Gwilherm Kerherve, Alexander Graf, Mark A. Isaacs, Hideki Nakajima
article en
4 citations

Abstract

ABSTRACT KherveFitting is a software written in Python and designed for fitting X‐ray photoelectron spectroscopy (XPS) data. It provides a user‐friendly graphical interface for researchers in materials science and surface analysis, offering features that include multiple background subtraction methods, various peak fitting models, and automated multipeak fitting with customisable constraints. This software aims to fill a gap in the market for XPS analysis tools, providing a freely available solution for users. This paper describes the software architecture and its theoretical background, including fitting algorithms and peak models. Its performance is validated by directly comparing quantification accuracy and peak fitting capabilities against established commercial software packages, demonstrating robust and reliable results across diverse test cases including ionic liquids, conducting oxides, and rare earth materials.

Surface and Interface AnalysisVol. 58(1)
National Physical Laboratory (GB), TU Dortmund University (DE), Synchrotron Light Research Institute (TH), Research Complex at Harwell (GB), University College London (GB), Imperial College London (GB), Cardiff University (GB)
Imperial College London, National Physical Laboratory
Openalex Percentile: Top 9%
Electron and X-Ray Spectroscopy Techniques
2.64
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KherveFitting: An Open Source Software for Fitting X‐Ray Photoelectron Spectroscopy Data — Benjamen P. Reed, William S. J. Skinner, et al. · Surface and Interface Analysis (2025) | TGRS Research Map | TGRS