Scalable Integration of Single-Crystalline Ag Nanosheets for Threshold Voltage Engineering in Oxide Thin-Film Transistors
Amorphous oxide semiconductor-based thin-film transistors (TFTs), particularly those utilizing indium gallium zinc oxide (IGZO), have garnered significant attention for next-generation display backplanes and flexible electronics. However, the precise and reliable modulation of threshold voltage (<i>V</i><sub>th</sub>) remains a persistent challenge, often requiring doping or vacancy engineering approaches that compromise process uniformity and device reliability. In this study, we introduce a scalable and low-temperature strategy for <i>V</i><sub>th</sub> tuning via the incorporation of two-dimensional (2D), single-crystalline silver nanosheets (Ag NSs) within the IGZO channel. These quasi-two-dimensional nanostructures have nanometer-scale thickness and lateral single crystallinity and are assembled using an ultrasonic-driven solution process that allows tunable coverage over large-area substrates. By varying Ag NS coverage up to 6.8%, we achieve a systematic and reproducible positive shift in <i>V</i><sub>th</sub>, with minimal degradation in mobility, on/off ratio, and subthreshold swing. Mechanistic studies using X-ray photoelectron spectroscopy and electrical bias stress testing reveal that the modulation arises from Schottky barrier formation and electrostatic screening at the Ag-IGZO interface rather than from modulation of oxygen vacancy concentrations. Devices incorporating Ag NSs exhibit excellent stability, with minimal hysteresis (Δ<i>V</i><sub>th</sub> ≈ 1 V), negligible parameter drift under a ±20 V gate bias stress for 60 min, and long-term retention after 390 days of ambient storage. To validate the circuit-level applicability of this method, we fabricated depletion-load NMOS inverters combining pristine and Ag NS-modified IGZO TFTs, wherein the switching threshold could be finely tuned via the Ag NS coverage. This work demonstrates a wafer-compatible and solution-processable route to deterministic <i>V</i><sub>th</sub> engineering in oxide TFTs, offering a promising platform for future high-performance, flexible, and large-area electronic systems.
Authors
- Jae‐Keun Kim (ORCID: https://orcid.org/0009-0009-6810-5873)
- Sukang Bae (ORCID: https://orcid.org/0000-0002-3019-0584)
- Seoung‐Ki Lee (ORCID: https://orcid.org/0000-0002-8786-0251)
- Seokhyeon Baek (ORCID: https://orcid.org/0009-0006-1239-546X)
- S.S. Kim
- Byung Joon Moon (ORCID: https://orcid.org/0000-0002-6952-502X)
- Hyeonji Joo (ORCID: https://orcid.org/0009-0003-6412-7836)
- Tae‐Wook Kim (ORCID: https://orcid.org/0000-0003-2157-732X)
- Do‐Hyung Kim (ORCID: https://orcid.org/0000-0003-2536-0101)
- Sungjun Park (ORCID: https://orcid.org/0000-0001-9603-902X)
- Daehong Kim (ORCID: https://orcid.org/0000-0003-2169-6708)
- Sneha Bhise
- Hee Yun Yang
- Youngseok Song
Institutions
- ON Semiconductor (United States) (US)
- Korea Electric Power Corporation (South Korea) (KR)
- Max Planck Institute of Microstructure Physics (DE)
- Korea Institute of Materials Science (KR)
- Institute for Renewable Energy (Poland) (PL)
- Printed Electronics (United Kingdom) (GB)
- Pusan National University (KR)
- Ajou University (KR)
- Jeonbuk National University (KR)
Publication Details
- Journal
- ACS Nano
- Published
- 2025-11-14
- DOI
- https://doi.org/10.1021/acsnano.5c13526
- Citations
- 1
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73