Mapping charge density in operating 2D transistors with high-contrast optical microscopy techniques

Authors

Vincent Derycke (ORCID: https://orcid.org/0000-0002-3272-9694)
Nathan Ullberg (ORCID: https://orcid.org/0000-0002-7264-7992)
Kévin Jaouen (ORCID: https://orcid.org/0000-0002-2213-4961)
Ermes Peci (ORCID: https://orcid.org/0000-0001-8536-3705)
Stéphane Campidelli (ORCID: https://orcid.org/0000-0001-6060-4891)
M. Magnozzi (ORCID: https://orcid.org/0000-0003-4512-8430)

Institutions

University of Geneva (CH)
Centre National de la Recherche Scientifique (FR)
Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR)
Université Paris-Saclay (FR)
Service Interdisciplinaire sur les Systèmes Moléculaires et les Matériaux (FR)
CEA Paris-Saclay (FR)
Nanosciences et Innovation pour les Matériaux, la Biomédecine et l'Énergie (FR)

Publication Details

Journal: SPIRE - Sciences Po Institutional REpository
Published: 2025-06-30
Primary Topic: Integrated Circuits and Semiconductor Failure Analysis
Type: article
Field-Weighted Citation Impact: 0.00

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article

Mapping charge density in operating 2D transistors with high-contrast optical microscopy techniques

Vincent Derycke, Nathan Ullberg, Kévin Jaouen, Ermes Peci et al.

Jun 30, 2025

SPIRE - Sciences Po Institutional REpository

Integrated Circuits and Semiconductor Failure Analysis

article

Mapping charge density in operating 2D transistors with high-contrast optical microscopy techniques

Vincent Derycke, Nathan Ullberg, Kévin Jaouen, Ermes Peci, Stéphane Campidelli, M. Magnozzi

June 30, 2025article en

Abstract

No abstract available for this paper.

SPIRE - Sciences Po Institutional REpository

University of Geneva (CH), Centre National de la Recherche Scientifique (FR), Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR), Université Paris-Saclay (FR), Service Interdisciplinaire sur les Systèmes Moléculaires et les Matériaux (FR), CEA Paris-Saclay (FR), Nanosciences et Innovation pour les Matériaux, la Biomédecine et l'Énergie (FR)

Openalex Percentile: Top 64%

Integrated Circuits and Semiconductor Failure Analysis

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