Atomic-Layer-Deposited Aluminum Oxide (Al <sub>2</sub> O <sub>3</sub> ) as a Barrier for Local Oxidation of Silicon

The LOCal Oxidation of Silicon (LOCOS) is a widely used technological process that conventionally exploits hundreds-of-nanometer-thick silicon nitride (SiN) layers as the mask to locally prevent the silicon surface to be oxidized. Here, investigations of the use of ultrathin (<20 nm) Al2O3 layers grown by atomic layer deposition (ALD) as material-sparing alternative to SiN are reported. A significant reduction of the oxidation rate by a factor greater than 15 is demonstrated for either dry thermal and plasma oxidations, paving the way toward more environmentally sustainable LOCOS processes for the fabrication of microelectronic and photonic devices.

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Publication Details

Journal
ACS Applied Electronic Materials
Published
2025-11-24
DOI
https://doi.org/10.1021/acsaelm.5c01944
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
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article

Atomic-Layer-Deposited Aluminum Oxide (Al 2 O 3 ) as a Barrier for Local Oxidation of Silicon

S. Calvez, Pascal Dubreuil, Manon Drob
ACS Applied Electronic Materials
Semiconductor materials and devices
article

Atomic-Layer-Deposited Aluminum Oxide (Al 2 O 3 ) as a Barrier for Local Oxidation of Silicon

S. Calvez, Pascal Dubreuil, Manon Drob
article en

Abstract

The LOCal Oxidation of Silicon (LOCOS) is a widely used technological process that conventionally exploits hundreds-of-nanometer-thick silicon nitride (SiN) layers as the mask to locally prevent the silicon surface to be oxidized. Here, investigations of the use of ultrathin (<20 nm) Al2O3 layers grown by atomic layer deposition (ALD) as material-sparing alternative to SiN are reported. A significant reduction of the oxidation rate by a factor greater than 15 is demonstrated for either dry thermal and plasma oxidations, paving the way toward more environmentally sustainable LOCOS processes for the fabrication of microelectronic and photonic devices.

ACS Applied Electronic MaterialsVol. 7(23)
Centre National de la Recherche Scientifique (FR), Université Fédérale de Toulouse Midi-Pyrénées (FR), Laboratoire d'Analyse et d'Architecture des Systèmes (FR)
Openalex Percentile: Top 64%
Semiconductor materials and devices
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