Atomic-Layer-Deposited Aluminum Oxide (Al <sub>2</sub> O <sub>3</sub> ) as a Barrier for Local Oxidation of Silicon
The LOCal Oxidation of Silicon (LOCOS) is a widely used technological process that conventionally exploits hundreds-of-nanometer-thick silicon nitride (SiN) layers as the mask to locally prevent the silicon surface to be oxidized. Here, investigations of the use of ultrathin (<20 nm) Al2O3 layers grown by atomic layer deposition (ALD) as material-sparing alternative to SiN are reported. A significant reduction of the oxidation rate by a factor greater than 15 is demonstrated for either dry thermal and plasma oxidations, paving the way toward more environmentally sustainable LOCOS processes for the fabrication of microelectronic and photonic devices.
Authors
- S. Calvez (ORCID: https://orcid.org/0000-0001-7788-5909)
- Pascal Dubreuil (ORCID: https://orcid.org/0000-0002-8307-2856)
- Manon Drob
Institutions
- Centre National de la Recherche Scientifique (FR)
- Université Fédérale de Toulouse Midi-Pyrénées (FR)
- Laboratoire d'Analyse et d'Architecture des Systèmes (FR)
Publication Details
- Journal
- ACS Applied Electronic Materials
- Published
- 2025-11-24
- DOI
- https://doi.org/10.1021/acsaelm.5c01944
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00