DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection
Reliable detection of X-ray tire defects is essential for safety and quality assurance in manufacturing. However, low contrast and high noise make traditional methods unreliable. This paper presents DyReCS-YOLO, a dynamic re-parameterized channel-shuffle network based on YOLOv8. The model introduces a C2f_DyRepFusion module combining dynamic convolution and a shuffle-and-routing mechanism, enabling adaptive kernel adjustment and efficient cross-channel interaction. Experiments on an industrial X-ray tire dataset containing 8326 images across 58 defect categories demonstrate that DyReCS-YOLO achieves an [email protected] of 0.741 and [email protected]:0.95 of 0.505, representing improvements of 4.5 and 2.8 percentage points over YOLOv8-s, and 9.2 and 7.7 percentage points over YOLOv11-s, respectively. The precision increases from 0.698 (YOLOv8-s) and 0.668 (YOLOv11-s) to 0.739, while maintaining real-time inference at 189.5 FPS, meeting industrial online detection requirements. Ablation results confirm that the combination of dynamic convolution and channel shuffle improves small-defect perception and robustness. Moreover, DyReCS-YOLO achieves an [email protected] of 0.975 on the public MT defect dataset, verifying its strong cross-domain generalization.
Authors
- Lei Tian (ORCID: https://orcid.org/0000-0002-1316-4456)
- Xiao‐chen Bai (ORCID: https://orcid.org/0000-0002-4234-5686)
- Quancheng Dong (ORCID: https://orcid.org/0000-0002-6590-3425)
- Qi Xu (ORCID: https://orcid.org/0000-0003-0546-5360)
- Youjie Zhou (ORCID: https://orcid.org/0000-0001-7188-6329)
- Jong‐In Han (ORCID: https://orcid.org/0009-0006-1274-3217)
Institutions
- University of Jinan (CN)
Publication Details
- Journal
- Electronics
- Published
- 2025-11-22
- DOI
- https://doi.org/10.3390/electronics14234570
- Primary Topic
- Advanced Neural Network Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00