DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection

Reliable detection of X-ray tire defects is essential for safety and quality assurance in manufacturing. However, low contrast and high noise make traditional methods unreliable. This paper presents DyReCS-YOLO, a dynamic re-parameterized channel-shuffle network based on YOLOv8. The model introduces a C2f_DyRepFusion module combining dynamic convolution and a shuffle-and-routing mechanism, enabling adaptive kernel adjustment and efficient cross-channel interaction. Experiments on an industrial X-ray tire dataset containing 8326 images across 58 defect categories demonstrate that DyReCS-YOLO achieves an [email protected] of 0.741 and [email protected]:0.95 of 0.505, representing improvements of 4.5 and 2.8 percentage points over YOLOv8-s, and 9.2 and 7.7 percentage points over YOLOv11-s, respectively. The precision increases from 0.698 (YOLOv8-s) and 0.668 (YOLOv11-s) to 0.739, while maintaining real-time inference at 189.5 FPS, meeting industrial online detection requirements. Ablation results confirm that the combination of dynamic convolution and channel shuffle improves small-defect perception and robustness. Moreover, DyReCS-YOLO achieves an [email protected] of 0.975 on the public MT defect dataset, verifying its strong cross-domain generalization.

Authors

Institutions

Publication Details

Journal
Electronics
Published
2025-11-22
DOI
https://doi.org/10.3390/electronics14234570
Primary Topic
Advanced Neural Network Applications
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection

Lei Tian, Xiao‐chen Bai, Quancheng Dong, Qi Xu et al.
Electronics
Advanced Neural Network Applications
article

DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection

Lei Tian, Xiao‐chen Bai, Quancheng Dong, Qi Xu, Youjie Zhou, Jong‐In Han
article en

Abstract

Reliable detection of X-ray tire defects is essential for safety and quality assurance in manufacturing. However, low contrast and high noise make traditional methods unreliable. This paper presents DyReCS-YOLO, a dynamic re-parameterized channel-shuffle network based on YOLOv8. The model introduces a C2f_DyRepFusion module combining dynamic convolution and a shuffle-and-routing mechanism, enabling adaptive kernel adjustment and efficient cross-channel interaction. Experiments on an industrial X-ray tire dataset containing 8326 images across 58 defect categories demonstrate that DyReCS-YOLO achieves an [email protected] of 0.741 and [email protected]:0.95 of 0.505, representing improvements of 4.5 and 2.8 percentage points over YOLOv8-s, and 9.2 and 7.7 percentage points over YOLOv11-s, respectively. The precision increases from 0.698 (YOLOv8-s) and 0.668 (YOLOv11-s) to 0.739, while maintaining real-time inference at 189.5 FPS, meeting industrial online detection requirements. Ablation results confirm that the combination of dynamic convolution and channel shuffle improves small-defect perception and robustness. Moreover, DyReCS-YOLO achieves an [email protected] of 0.975 on the public MT defect dataset, verifying its strong cross-domain generalization.

ElectronicsVol. 14(23)
University of Jinan (CN)
Openalex Percentile: Top 63%
Advanced Neural Network Applications
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection — Lei Tian, Xiao‐chen Bai, et al. · Electronics (2025) | TGRS Research Map | TGRS