Towards identifying the PL6 center in SiC: From first-principles screening to hyperfine validation of competing defect candidates

The PL6 color center in $4H$-SiC, known for its excellent ambient-temperature spin and optical properties, has an unresolved microscopic origin. In this first-principles study, we systematically investigate potential structures to clarify its nature. We first rigorously examine the DV-antisite hypothesis (a divacancy paired with a carbon antisite, ${\mathrm{C}}_{\mathrm{Si}}$), analyzing the energetic, electronic, and spin properties of various ${V}_{\mathrm{Si}}{V}_{\mathrm{C}}+{\mathrm{C}}_{\mathrm{Si}}$ configurations. Two ${\mathrm{C}}_{3\mathrm{v}}$-symmetric $\mathrm{kk}+{\mathrm{C}}_{\mathrm{Si}}$ complexes emerge as strong candidates within this framework. Subsequently, a critical comparison of hyperfine interaction signatures is performed between these candidates, the alternative OV model [specifically OV(hh) and OV(kk), an oxygen replacing C together with a Si vacancy], and experimental data. This analysis demonstrates that the OV(hh) structure more accurately reproduces PL6's hyperfine features. Furthermore, reevaluation of the proposed OV(hk) model for the related PL5 center reveals zero-field splitting parameter $E$ inconsistencies with experimental results, suggesting that PL5 and PL6 may have distinct origins. These findings provide crucial theoretical insights and motivate targeted experimental validation for these quantum defects.

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Publication Details

Journal
Physical Review Materials
Published
2025-11-24
DOI
https://doi.org/10.1103/nvnt-jtnt
Citations
2
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
1.46
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article

Towards identifying the PL6 center in SiC: From first-principles screening to hyperfine validation of competing defect candidates

Chang‐Kui Duan, Qi Zhang, Yu Chen, Mingzhe Liu et al.
2 citations
Physical Review Materials
Silicon Carbide Semiconductor Technologies
1.46
article

Towards identifying the PL6 center in SiC: From first-principles screening to hyperfine validation of competing defect candidates

Chang‐Kui Duan, Qi Zhang, Yu Chen, Mingzhe Liu, Xin Zhao
article en
2 citations

Abstract

The PL6 color center in $4H$-SiC, known for its excellent ambient-temperature spin and optical properties, has an unresolved microscopic origin. In this first-principles study, we systematically investigate potential structures to clarify its nature. We first rigorously examine the DV-antisite hypothesis (a divacancy paired with a carbon antisite, ${\mathrm{C}}_{\mathrm{Si}}$), analyzing the energetic, electronic, and spin properties of various ${V}_{\mathrm{Si}}{V}_{\mathrm{C}}+{\mathrm{C}}_{\mathrm{Si}}$ configurations. Two ${\mathrm{C}}_{3\mathrm{v}}$-symmetric $\mathrm{kk}+{\mathrm{C}}_{\mathrm{Si}}$ complexes emerge as strong candidates within this framework. Subsequently, a critical comparison of hyperfine interaction signatures is performed between these candidates, the alternative OV model [specifically OV(hh) and OV(kk), an oxygen replacing C together with a Si vacancy], and experimental data. This analysis demonstrates that the OV(hh) structure more accurately reproduces PL6's hyperfine features. Furthermore, reevaluation of the proposed OV(hk) model for the related PL5 center reveals zero-field splitting parameter $E$ inconsistencies with experimental results, suggesting that PL5 and PL6 may have distinct origins. These findings provide crucial theoretical insights and motivate targeted experimental validation for these quantum defects.

Physical Review MaterialsVol. 9(11)
University of Science and Technology of China (CN), Suzhou University of Science and Technology (CN), Hefei National Center for Physical Sciences at Nanoscale (CN), Zhejiang University (CN)
Openalex Percentile: Top 14%
Silicon Carbide Semiconductor Technologies
1.46
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Towards identifying the PL6 center in SiC: From first-principles screening to hyperfine validation of competing defect candidates — Chang‐Kui Duan, Qi Zhang, et al. · Physical Review Materials (2025) | TGRS Research Map | TGRS