Towards identifying the PL6 center in SiC: From first-principles screening to hyperfine validation of competing defect candidates
The PL6 color center in $4H$-SiC, known for its excellent ambient-temperature spin and optical properties, has an unresolved microscopic origin. In this first-principles study, we systematically investigate potential structures to clarify its nature. We first rigorously examine the DV-antisite hypothesis (a divacancy paired with a carbon antisite, ${\mathrm{C}}_{\mathrm{Si}}$), analyzing the energetic, electronic, and spin properties of various ${V}_{\mathrm{Si}}{V}_{\mathrm{C}}+{\mathrm{C}}_{\mathrm{Si}}$ configurations. Two ${\mathrm{C}}_{3\mathrm{v}}$-symmetric $\mathrm{kk}+{\mathrm{C}}_{\mathrm{Si}}$ complexes emerge as strong candidates within this framework. Subsequently, a critical comparison of hyperfine interaction signatures is performed between these candidates, the alternative OV model [specifically OV(hh) and OV(kk), an oxygen replacing C together with a Si vacancy], and experimental data. This analysis demonstrates that the OV(hh) structure more accurately reproduces PL6's hyperfine features. Furthermore, reevaluation of the proposed OV(hk) model for the related PL5 center reveals zero-field splitting parameter $E$ inconsistencies with experimental results, suggesting that PL5 and PL6 may have distinct origins. These findings provide crucial theoretical insights and motivate targeted experimental validation for these quantum defects.
Authors
- Chang‐Kui Duan (ORCID: https://orcid.org/0000-0003-1016-4976)
- Qi Zhang (ORCID: https://orcid.org/0000-0001-8889-2039)
- Yu Chen (ORCID: https://orcid.org/0000-0001-7882-1077)
- Mingzhe Liu (ORCID: https://orcid.org/0000-0003-3748-6107)
- Xin Zhao (ORCID: https://orcid.org/0009-0005-6540-6284)
Institutions
- University of Science and Technology of China (CN)
- Suzhou University of Science and Technology (CN)
- Hefei National Center for Physical Sciences at Nanoscale (CN)
- Zhejiang University (CN)
Publication Details
- Journal
- Physical Review Materials
- Published
- 2025-11-24
- DOI
- https://doi.org/10.1103/nvnt-jtnt
- Citations
- 2
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 1.46