InAlN/GaN Detectors for Real-Time Dosimetry in Ultra-High Dose Rate FLASH Radiotherapy
This letter reports the first characterization of InAlN/GaN-on-Si solid-state detectors under ultra-high dose-per-pulse (UH-DPP) electron irradiation for FLASH radiotherapy applications. Unpassivated Ni/Au metal-semiconductor-metal (MSM) and two-dimensional electron gas (2DEG) interdigital transducer (IDT) detectors exhibited the best transient performance, with the 2DEG IDT resolving individual pulses as short as 3 μs rise and 325 μs fall times and achieving a signal-to-noise ratio (SNR) exceeding 220 under 2 Gy pulses. Across a dose-per-pulse (DPP) range of 0.05-0.5 Gy, the 2DEG IDT detector demonstrated consistent, dose-dependent voltage responses with sensitivities of 0.5-0.9 V/Gy and a normalized sensitivity of 48.75 nC/Gy/mm<sup>2</sup>, one to two orders of magnitude higher than reported SiC and diamond detectors. These results establish InAlN/GaN detectors as promising candidates for compact, high-speed, and radiation-tolerant dosimetry systems capable of real-time single-pulse monitoring in clinical FLASH radiotherapy.
Authors
- Guy Garty (ORCID: https://orcid.org/0000-0001-5683-7318)
- Yi-Chen Liu (ORCID: https://orcid.org/0009-0002-2361-5705)
- Michael Bardash
- Si‐Young Choi (ORCID: https://orcid.org/0000-0003-1648-142X)
- Kevin Dai (ORCID: https://orcid.org/0000-0002-5895-0450)
- Andrew Harken
- Ioannis Kymissis (ORCID: https://orcid.org/0000-0001-7417-1759)
- Peter Ballentine (ORCID: https://orcid.org/0000-0002-9971-7540)
- Ilaria Fratelli (ORCID: https://orcid.org/0000-0001-6292-0118)
- Yuewen Tan (ORCID: https://orcid.org/0000-0001-5932-0824)
- Savannah R. Eisner (ORCID: https://orcid.org/0000-0003-2423-2597)
- Carryn M. Anderson (ORCID: https://orcid.org/0000-0001-5036-8389)
Institutions
- University of Illinois Urbana-Champaign (US)
- Osservatorio astronomico di Bologna (IT)
- Detector Technology (United States) (US)
- Columbia University (US)
- University of Bologna (IT)
Publication Details
- Journal
- IEEE Sensors Letters
- Published
- 2025-11-24
- DOI
- https://doi.org/10.1109/lsens.2025.3636392
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00