Selective Growth of Ferroelectric Ultrathin Nonlayered γ‐In <sub>2</sub> Se <sub>3</sub>
Indium selenide (In<sub>2</sub>Se<sub>3</sub>) has received increasing interest due to its diverse polytypes and associated polytype-dependent ferroelectric properties, making it one of the promising platforms guiding the development of ultrathin ferroelectric nanodevices. To date, α-, β-, and β'-phase In<sub>2</sub>Se<sub>3</sub> have been well studied, but nonlayered γ-In<sub>2</sub>Se<sub>3</sub> remains underexplored because of sophisticated formation paths and minor energy differences with other phases. Therefore, understanding the growth mechanisms and electronic structures of γ-In<sub>2</sub>Se<sub>3</sub> is crucial to present the full roadmap of the In<sub>x</sub>Se<sub>y</sub> family. Herein, a precursor-guided chemical vapor deposition (CVD) method is proposed to selectively grow ultrathin γ-In<sub>2</sub>Se<sub>3</sub> crystals with a nonlayered, vacancy-ordered screw form (VOSF) structure. The sublimation temperature of precursors plays a critical role in selectively synthesizing α-, β-, and γ-phase In<sub>2</sub>Se<sub>3</sub> using different precursors (In<sub>2</sub>Se<sub>3</sub>, In<sub>2</sub>O<sub>3</sub>, InCl<sub>3</sub>). Ex situ scanning transmission electron microscopy (STEM) reveals a γ-In<sub>2</sub>Se<sub>3</sub>-to-InSe phase transition at 600 °C, consecutively triggered by interlayer bonds broken, vacancy reorganization and removal of Se atoms. Away from existing literature, only out-of-plane ferroelectricity in γ-In<sub>2</sub>Se<sub>3</sub>, driven by vertical off-center displacements of Se atoms, is detected. Therefore, a full spectrum of In<sub>2</sub>Se<sub>3</sub>'s polytypes, particularly nonlayered ferroelectric γ-In<sub>2</sub>Se<sub>3</sub>, is selectively obtained, presenting great potential for next-generation In<sub>2</sub>Se<sub>3</sub>-based polytypes-dependent nanoelectromechanical and memory devices.
Authors
- Xin Luo (ORCID: https://orcid.org/0000-0002-7997-3934)
- Yinfeng Long (ORCID: https://orcid.org/0000-0001-9553-4619)
- Runlai Li
- Xiaoxu Zhao (ORCID: https://orcid.org/0000-0001-9746-3770)
- Libin Wan (ORCID: https://orcid.org/0000-0002-3229-9145)
- Han Chen (ORCID: https://orcid.org/0000-0002-3727-6823)
- Yan Li (ORCID: https://orcid.org/0000-0003-0607-3166)
- Lin Wang (ORCID: https://orcid.org/0000-0003-3430-7345)
- Ziyi Han (ORCID: https://orcid.org/0009-0001-9456-9948)
Institutions
- Sun Yat-sen University (CN)
- Shanghai Jiao Tong University (CN)
- Peking University (CN)
- Sichuan University (CN)
- Taiyuan University of Technology (CN)
Publication Details
- Journal
- Advanced Materials
- Published
- 2025-11-19
- DOI
- https://doi.org/10.1002/adma.202516548
- Citations
- 1
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.73