Integrated Streak Camera with on Chip Analog Averaging for Low Light Level Imaging

We propose a technique to suppress the noise of Trans-Impedance Amplifiers (TIAs) in an integrated streak camera for repeatable input signals. This approach requires only a minor modification to the sensor architecture, involving the addition of a single power supply connected to the column buffer of the sampling cell. The noise rejection mechanism operates independently of the system's effective bandwidth. Simulation results demonstrate a reduction in TIA noise from 5.2 mV to 0.31 mV, which corresponds to the fundamental limit imposed by thermal noise on the sampling capacitor (kTC noise). As a result, the signal-to-noise ratio improves by more than an order of magnitude, achieving over a tenfold enhancement with an acquisition time of just <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$20 \mu ~\mathrm{s}$</tex>, enabled by the on-chip analog averaging feature. This noise reduction capability enables the detection of low-light signals, allowing the system to accurately measure optical pulses containing as few as 300 photoelectrons with a signal-to-noise ratio (SNR) exceeding 10 and a full width at half maximum (FWHM) of 200 ps.

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Publication Details

Published
2025-06-22
DOI
https://doi.org/10.1109/newcas64648.2025.11107164
Primary Topic
Advanced Optical Sensing Technologies
Type
article
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article

Integrated Streak Camera with on Chip Analog Averaging for Low Light Level Imaging

Wilfried Uhring, Pierre Willinger-Adam, Jean-Baptiste Schell
Advanced Optical Sensing Technologies
article

Integrated Streak Camera with on Chip Analog Averaging for Low Light Level Imaging

Wilfried Uhring, Pierre Willinger-Adam, Jean-Baptiste Schell
article en

Abstract

We propose a technique to suppress the noise of Trans-Impedance Amplifiers (TIAs) in an integrated streak camera for repeatable input signals. This approach requires only a minor modification to the sensor architecture, involving the addition of a single power supply connected to the column buffer of the sampling cell. The noise rejection mechanism operates independently of the system's effective bandwidth. Simulation results demonstrate a reduction in TIA noise from 5.2 mV to 0.31 mV, which corresponds to the fundamental limit imposed by thermal noise on the sampling capacitor (kTC noise). As a result, the signal-to-noise ratio improves by more than an order of magnitude, achieving over a tenfold enhancement with an acquisition time of just <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$20 \mu ~\mathrm{s}$</tex>, enabled by the on-chip analog averaging feature. This noise reduction capability enables the detection of low-light signals, allowing the system to accurately measure optical pulses containing as few as 300 photoelectrons with a signal-to-noise ratio (SNR) exceeding 10 and a full width at half maximum (FWHM) of 200 ps.

Centre National de la Recherche Scientifique (FR), Laboratoire des Sciences de l'Ingénieur, de l'Informatique et de l'Imagerie (FR), Université de Strasbourg (FR)
Openalex Percentile: Top 65%
Advanced Optical Sensing Technologies
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