Analogous electromagnetically induced reflection with multiband on all-metal metamaterials
In this paper, an all-metal metamaterial is studied and its reflectance is analyzed by simulation software. The analogous electromagnetically induced reflection effect is analyzed by studying the electric field distribution of each frequency. When studying the structure change, it is found that the structure also has bound states in the continuous phenomenon. Measured in a microwave anechoic chamber, it is found that the measured results are basically in agreement with the simulation results. This research has potential applications in filtering, sensing, and so on, which is due to the advantages of simple and cost-effective processing of all-metal metamaterials.
Authors
- Zhenhai Chen (ORCID: https://orcid.org/0000-0002-6704-7546)
- Renxia Ning (ORCID: https://orcid.org/0000-0002-1229-7476)
- Liang Li (ORCID: https://orcid.org/0000-0003-4008-7190)
- Ji Wu (ORCID: https://orcid.org/0000-0002-0827-7317)
Institutions
- Suzhou Polytechnic Institute of Agriculture (CN)
- Huangshan University (CN)
Publication Details
- Journal
- AIP Advances
- Published
- 2025-11-01
- DOI
- https://doi.org/10.1063/5.0285422
- Primary Topic
- Metamaterials and Metasurfaces Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00