Enhancd Copper Adhesion on Glass Via Adhesion Promotion Coating

Seed copper metallization on glass has been achieved by simple wet chemistry methods that involve deposition an adhesion promoting organic material which enables metallization without any special or high-temperature treatment of the glass substrate. The coating is catalytically activated by depositing atomic palladium using LMIx®, a Liquid Metal Ink organic precursor of palladium with a low contact angle, in which the “x” subscript denotes formulaic tailoring to specific substrate applications. Catalytic atomic palladium was generated on the organic coating by thermal processing at <230°C or in fact at room temperature by using an appropriate reducing agent. The catalytic layer/s of atomic palladium respond faithfully to commercial electroless copper chemistries furnishing a conductive copper layer. The adhesion of the copper layer was tested using conventional cross-hatch testing and nano-scratch testing methods. AFM was used as a tool to monitor changes in surface roughness during multiple process steps. FESEM/EDX spectra were taken after catalytic palladium and SEM of electroless copper deposition. Also, XPS imaging was used to further understanding the chemical conversion of atomic palladium. DSC/TG runs of the atomic palladium ink formulation in air were used to suggest appropriate thermal processing parameters. Sheet resistance of electroless copper was assessed by the 4-point probe method. Glass substrates with high aspect-ratio Through Glass Vias were subjected to BIB/FIB followed by SEM/EDS analysis to determine coverage and conformality of electroless copper deposition in the vias.

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Publication Details

Journal
IMAPSource Proceedings
Published
2025-11-10
DOI
https://doi.org/10.4071/001c.147206
Primary Topic
Copper Interconnects and Reliability
Type
article
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article

Enhancd Copper Adhesion on Glass Via Adhesion Promotion Coating

Roger H. Terrill, Simon McElrea, Sen-Tien Kao, S.C. Sharma et al.
IMAPSource Proceedings
Copper Interconnects and Reliability
article

Enhancd Copper Adhesion on Glass Via Adhesion Promotion Coating

Roger H. Terrill, Simon McElrea, Sen-Tien Kao, S.C. Sharma, Y. C. Yeh
article en

Abstract

Seed copper metallization on glass has been achieved by simple wet chemistry methods that involve deposition an adhesion promoting organic material which enables metallization without any special or high-temperature treatment of the glass substrate. The coating is catalytically activated by depositing atomic palladium using LMIx®, a Liquid Metal Ink organic precursor of palladium with a low contact angle, in which the “x” subscript denotes formulaic tailoring to specific substrate applications. Catalytic atomic palladium was generated on the organic coating by thermal processing at <230°C or in fact at room temperature by using an appropriate reducing agent. The catalytic layer/s of atomic palladium respond faithfully to commercial electroless copper chemistries furnishing a conductive copper layer. The adhesion of the copper layer was tested using conventional cross-hatch testing and nano-scratch testing methods. AFM was used as a tool to monitor changes in surface roughness during multiple process steps. FESEM/EDX spectra were taken after catalytic palladium and SEM of electroless copper deposition. Also, XPS imaging was used to further understanding the chemical conversion of atomic palladium. DSC/TG runs of the atomic palladium ink formulation in air were used to suggest appropriate thermal processing parameters. Sheet resistance of electroless copper was assessed by the 4-point probe method. Glass substrates with high aspect-ratio Through Glass Vias were subjected to BIB/FIB followed by SEM/EDS analysis to determine coverage and conformality of electroless copper deposition in the vias.

IMAPSource ProceedingsVol. 2025(Symposium)
IQ Samhällsbyggnad (SE), San Jose State University (US)
Openalex Percentile: Top 75%
Copper Interconnects and Reliability
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Enhancd Copper Adhesion on Glass Via Adhesion Promotion Coating — Roger H. Terrill, Simon McElrea, et al. · IMAPSource Proceedings (2025) | TGRS Research Map | TGRS