Enhanced Voltage Reference Circuit Design Using Quadratic Function Modeling of MOSFET Characteristics in the Saturation Region

This paper investigates a voltage reference circuit that incorporates an equivalent MOSFET, which adjusts the threshold voltage and its temperature coefficient using a Proportional To Absolute Temperature (PTAT) voltage generation circuit. In previous designs, the relationship between the drain current I<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">D</inf> and the gate-source voltageV<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">GS</inf> was derived based on the threshold voltage V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">th</inf> from the gradual channel model of MOSFETs. However, this method led to discrepancies between theory and simulation. We propose a new approach where the I<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">D</inf> - V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">GS</inf> characteristics are modeled using simulation data from a single NMOSFET, fitted to a general quadratic function. This model significantly reduces the error between theoretical calculations and simulation results. Additionally, the temperature coefficient of the reference voltage V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ref</inf> is improved from 498 ppm/K to 32 ppm/K.

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Published
2025-11-17
DOI
https://doi.org/10.1109/icecs66544.2025.11270597
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
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article

Enhanced Voltage Reference Circuit Design Using Quadratic Function Modeling of MOSFET Characteristics in the Saturation Region

Yann Deval, Kazuyuki Wada, H. Lapuyade
Advancements in Semiconductor Devices and Circuit Design
article

Enhanced Voltage Reference Circuit Design Using Quadratic Function Modeling of MOSFET Characteristics in the Saturation Region

Yann Deval, Kazuyuki Wada, H. Lapuyade
article en

Abstract

This paper investigates a voltage reference circuit that incorporates an equivalent MOSFET, which adjusts the threshold voltage and its temperature coefficient using a Proportional To Absolute Temperature (PTAT) voltage generation circuit. In previous designs, the relationship between the drain current I<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">D</inf> and the gate-source voltageV<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">GS</inf> was derived based on the threshold voltage V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">th</inf> from the gradual channel model of MOSFETs. However, this method led to discrepancies between theory and simulation. We propose a new approach where the I<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">D</inf> - V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">GS</inf> characteristics are modeled using simulation data from a single NMOSFET, fitted to a general quadratic function. This model significantly reduces the error between theoretical calculations and simulation results. Additionally, the temperature coefficient of the reference voltage V<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">ref</inf> is improved from 498 ppm/K to 32 ppm/K.

Université de Bordeaux (FR), Meiji University (JP), Laboratoire de l'Intégration du Matériau au Système (FR), Institut Polytechnique de Bordeaux (FR)
Openalex Percentile: Top 66%
Advancements in Semiconductor Devices and Circuit Design
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