Challenges in Fault Diagnosis of Nonlinear Circuits

The paper focuses on fault diagnosis in nonlinear analog circuits, a topic that has been explored in the literature for over 50 years but remains unresolved due to its complex nature. It reviews various aspects of nonlinear circuit diagnosis, including methods for assessing testability, selecting diagnostic tests, and conducting diagnostic processes through simulation before and after test methods. The paper also discusses the use of artificial intelligence tools in this context. Given the specific characteristics of nonlinear circuits used as DC-DC converters and the wealth of the existing literature—including review papers on the subject—this issue is addressed only briefly. The main aim of the paper is to identify research challenges in fault diagnosis for a general class of nonlinear circuits. To illustrate and discuss these challenges, the paper provides examples, including ambiguity in diagnostic equation solutions, multiple equilibrium points, and the effects of self-heating. These examples can serve as simple benchmarks for new proposals to advance comprehensive diagnosis methods for nonlinear circuits.

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Publication Details

Journal
Electronics
Published
2025-11-13
DOI
https://doi.org/10.3390/electronics14224427
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

Challenges in Fault Diagnosis of Nonlinear Circuits

Stanisław Hałgas
Electronics
VLSI and Analog Circuit Testing
article

Challenges in Fault Diagnosis of Nonlinear Circuits

Stanisław Hałgas
article en

Abstract

The paper focuses on fault diagnosis in nonlinear analog circuits, a topic that has been explored in the literature for over 50 years but remains unresolved due to its complex nature. It reviews various aspects of nonlinear circuit diagnosis, including methods for assessing testability, selecting diagnostic tests, and conducting diagnostic processes through simulation before and after test methods. The paper also discusses the use of artificial intelligence tools in this context. Given the specific characteristics of nonlinear circuits used as DC-DC converters and the wealth of the existing literature—including review papers on the subject—this issue is addressed only briefly. The main aim of the paper is to identify research challenges in fault diagnosis for a general class of nonlinear circuits. To illustrate and discuss these challenges, the paper provides examples, including ambiguity in diagnostic equation solutions, multiple equilibrium points, and the effects of self-heating. These examples can serve as simple benchmarks for new proposals to advance comprehensive diagnosis methods for nonlinear circuits.

ElectronicsVol. 14(22)
Lodz University of Technology (PL)
Openalex Percentile: Top 62%
VLSI and Analog Circuit Testing
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Challenges in Fault Diagnosis of Nonlinear Circuits — Stanisław Hałgas · Electronics (2025) | TGRS Research Map | TGRS