High-precision 12-times optical subdivision heterodyne laser interferometer for short-distance measurement

Heterodyne laser interferometers are based on high-directional and high-coherence laser wavelengths, have broad application prospects in the fields of nano-scale multi-axis joint control of ultra-precision five-axis machine tools and sub-nano alignment positioning of high-end lithography machines. It is necessary to improve the measurement accuracy of the measurement mirror group to enhance its theoretical resolution limit. However, traditional heterodyne methods are limited by optical subdivision accuracy and spatial positioning accuracy. To meet this challenge, we propose a high-precision 12-times optical subdivision heterodyne laser interferometer for short-distance measurement, which not only avoids the problems of measurement accuracy reduction due to insufficient optical subdivision multiples and the difficulty of adjustment due to the increase in the number of reflections, but also reduces the influence of periodic nonlinear errors. By introducing space position and equal optical path, it makes better use of the Doppler frequency shift information superposition characteristic of short distance interferometry, compared with the traditional 4-times optical subdivision mirror group. It further proves the advantages of the proposed 12-times optical subdivision mirror group in short distance high-precision measurement, and its theoretical resolution is better than 0.103 nm. Experiments prove that the actual test results show the dynamic resolution is better than 1 nm, the dynamic error in vertical movement state is better than ±10nm@20 mm, the dynamic error in horizontal movement state is better than 35 nm@20 mm, and the stable step measurement error is better than ±1 nm. Therefore, the proposed method is effective for ultra-precise positioning and ultra-precise displacement measurement.

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Publication Details

Journal
Optics Express
Published
2025-11-14
DOI
https://doi.org/10.1364/oe.577511
Citations
2
Primary Topic
Advanced Measurement and Metrology Techniques
Type
article
Field-Weighted Citation Impact
1.43
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article

High-precision 12-times optical subdivision heterodyne laser interferometer for short-distance measurement

Xinyu Sun, Zhen Mao, Zhaohui Li, Shaopeng Wang et al.
2 citations
Optics Express
Advanced Measurement and Metrology Techniques
1.43
article

High-precision 12-times optical subdivision heterodyne laser interferometer for short-distance measurement

Xinyu Sun, Zhen Mao, Zhaohui Li, Shaopeng Wang, Yongxin Liu, Yunfei Yin, Zhen Ma, S. Yin, Jianke Zhao
article en
2 citations

Abstract

Heterodyne laser interferometers are based on high-directional and high-coherence laser wavelengths, have broad application prospects in the fields of nano-scale multi-axis joint control of ultra-precision five-axis machine tools and sub-nano alignment positioning of high-end lithography machines. It is necessary to improve the measurement accuracy of the measurement mirror group to enhance its theoretical resolution limit. However, traditional heterodyne methods are limited by optical subdivision accuracy and spatial positioning accuracy. To meet this challenge, we propose a high-precision 12-times optical subdivision heterodyne laser interferometer for short-distance measurement, which not only avoids the problems of measurement accuracy reduction due to insufficient optical subdivision multiples and the difficulty of adjustment due to the increase in the number of reflections, but also reduces the influence of periodic nonlinear errors. By introducing space position and equal optical path, it makes better use of the Doppler frequency shift information superposition characteristic of short distance interferometry, compared with the traditional 4-times optical subdivision mirror group. It further proves the advantages of the proposed 12-times optical subdivision mirror group in short distance high-precision measurement, and its theoretical resolution is better than 0.103 nm. Experiments prove that the actual test results show the dynamic resolution is better than 1 nm, the dynamic error in vertical movement state is better than ±10nm@20 mm, the dynamic error in horizontal movement state is better than 35 nm@20 mm, and the stable step measurement error is better than ±1 nm. Therefore, the proposed method is effective for ultra-precise positioning and ultra-precise displacement measurement.

Optics ExpressVol. 33(24)
Xi'an Institute of Optics and Precision Mechanics (CN), University of Chinese Academy of Sciences (CN)
Openalex Percentile: Top 17%
Advanced Measurement and Metrology Techniques
1.43
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