Enhanced sampling density in one-shot polarization interferometry with a polarization camera

This paper introduces a technique to enhance the sampling density in one-shot phase imaging with a polarization camera, thereby overcoming the limited sampling density of the 2 × 2-pixel configuration, which generates a reconstructed image only one-quarter the size of the original. The effectiveness of the proposed technique was evaluated using a Michelson interferometer to adjust the fringe spacing. In experiments with an original image resolution of M × N , the conventional approach yielded a phase image with a resolution of [ (M/2)] × [(N/2)] , whereas the proposed technique yielded an image resolution of ( M–1) × (N–1) , which is very close to the original.

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Publication Details

Journal
Optics Continuum
Published
2025-11-13
DOI
https://doi.org/10.1364/optcon.575862
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
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article

Enhanced sampling density in one-shot polarization interferometry with a polarization camera

Hsi-Hsun Tsai, Ju-Yi Lee
Optics Continuum
Optical measurement and interference techniques
article

Enhanced sampling density in one-shot polarization interferometry with a polarization camera

Hsi-Hsun Tsai, Ju-Yi Lee
article en

Abstract

This paper introduces a technique to enhance the sampling density in one-shot phase imaging with a polarization camera, thereby overcoming the limited sampling density of the 2 × 2-pixel configuration, which generates a reconstructed image only one-quarter the size of the original. The effectiveness of the proposed technique was evaluated using a Michelson interferometer to adjust the fringe spacing. In experiments with an original image resolution of M × N , the conventional approach yielded a phase image with a resolution of [ (M/2)] × [(N/2)] , whereas the proposed technique yielded an image resolution of ( M–1) × (N–1) , which is very close to the original.

Optics ContinuumVol. 4(12)
Openalex Percentile: Top 65%
Optical measurement and interference techniques
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