Optimized Hyperdimensional Edge AI Evaluation for Efficiency and Reliability under Real Radiation
Hyperdimensional Computing (HDC) is an emerging AI algorithm, touted to be an efficient, neuro-inspired and reliable alternative to neural networks for Edge AI. HDC utilizes hypervectors with several thousand elements; the number of elements in these hypervectors denotes the HDC dimension. This dimension can be optimized for improving the efficiency and reliability of HDC inference against errors such as bit-flips, which can be caused by environmental radiation-induced soft errors. We hypothesize that, by reducing the runtime chip area and execution time utilized by HDC inference through lowering dimensionality, both efficiency and reliability against soft error-induced bit-flips can be simultaneously improved while trading off a negligible amount of accuracy and error threshold. We tested our hypothesis by executing an HDC inference algorithm with two different dimension values, 10000 (10k) and 1024, on a commercially available, low-power, bare-metal ARM platform with a Cortex-M4 processor. We conducted the efficiency analysis by measuring the CPU cycles and energy required for executing the algorithm, and the reliability analysis using real-world atmospheric-like neutron radiation from the ChipIr facility in Oxfordshire, UK. Analyses revealed that, by lowering the HDC dimension from 10k to 1024, the reliability of HDC inference against soft error-induced bit-flips was 3.5 times better and efficiency improved by more than 16 times. This innovative observation contrasts the prevailing understanding in the community that increasing the HDC dimension always improves robustness or reliability. To the best of our knowledge, our work is the first to study the reliability of HDC inference using real-world radiation.
Authors
- Siegfried Mercelis (ORCID: https://orcid.org/0000-0001-9355-6566)
- Laura Smets (ORCID: https://orcid.org/0000-0002-5353-9953)
- Ynte Vanderhoydonc (ORCID: https://orcid.org/0000-0001-6835-3302)
- Jeroen Famaey (ORCID: https://orcid.org/0000-0002-3587-1354)
- Ritesh Kumar Singh (ORCID: https://orcid.org/0000-0001-9373-4799)
- Paolo Rech (ORCID: https://orcid.org/0000-0002-9597-1007)
- Anuj Justus Rajappa (ORCID: https://orcid.org/0000-0001-8167-9171)
- Philippe Reiter (ORCID: https://orcid.org/0000-0002-2548-7172)
Institutions
- University of Antwerp (BE)
- University of Trento (IT)
- Province of Antwerp (BE)
Publication Details
- Journal
- ACM Transactions on Embedded Computing Systems
- Published
- 2025-11-11
- DOI
- https://doi.org/10.1145/3773032
- Primary Topic
- Ferroelectric and Negative Capacitance Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00