Development of soft X-ray microscope with a four-pole magnet
Soft X-ray microscopic experiments, such as scanning X-ray microscopy (SXM) and coherent X-ray imaging (CDI), have emerged as powerful techniques for investigating magnetic materials. However, X-ray imaging experiments under external magnetic fields with flexible orientation remain limited. We have developed a soft X-ray microscope equipped with a four-pole electromagnet, enabling imaging experiments magnetic field orientations continuously adjustable from parallel to perpendicular to the incident X-ray beam. This unique capability allows versatile experimental configurations, facilitating static magnetic imaging and advanced time-resolved imaging. We performed time-resolved SXM measurements on two different types of NiFe (permalloy) samples, successfully capturing the collective magnetization dynamics induced by ferromagnetic resonance effect. Furthermore, CDI measurement is demonstrated on multiferroic BiFeO[Formula: see text], visualizing sinusoidal magnetic structures with a spatial periodicity on the order of ten nanometers. The results highlight the efficiency of the developed X-ray microscope as a platform for studying the dynamics and complex spin textures of magnetic materials and spintronic devices.
Authors
- Hironori Nakao (ORCID: https://orcid.org/0000-0003-4020-537X)
- T. Arima (ORCID: https://orcid.org/0000-0002-6959-0454)
- Yusuke Kozuka (ORCID: https://orcid.org/0000-0001-7674-600X)
- Shiro Kawachi (ORCID: https://orcid.org/0000-0003-1554-4273)
- T. Ito (ORCID: https://orcid.org/0000-0003-2094-2807)
- Yusuke Wakabayashi (ORCID: https://orcid.org/0000-0003-3107-0338)
- Yuichi Yamasaki (ORCID: https://orcid.org/0000-0002-8560-3462)
- Yuta Ishii (ORCID: https://orcid.org/0000-0002-8957-5833)
Institutions
- High Energy Accelerator Research Organization (JP)
- University of Hyogo (JP)
- Tohoku University (JP)
- National Institute for Materials Science (JP)
- Japan Science and Technology Agency (JP)
- RIKEN (JP)
- RIKEN Center for Emergent Matter Science (JP)
- National Institute of Advanced Industrial Science and Technology (JP)
- The University of Tokyo (JP)
Publication Details
- Journal
- Science and Technology of Advanced Materials Methods
- Published
- 2025-11-10
- DOI
- https://doi.org/10.1080/27660400.2025.2586300
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00