Single-shot, single-mask X-ray dark-field, and phase-contrast imaging

X-ray phase-contrast imaging (XPCI) and dark-field (DF) imaging can potentially provide enhanced contrast beyond attenuation by detecting phase shifts and ultra-small-angle X-ray scattering (USAXS), but most implementations rely on multiple exposures, very high magnification geometry, precision motion, or ultra-high-resolution detectors. In this study, we present a single-mask, single-exposure framework that captures attenuation, differential phase contrast (DPC), and dark-field using mask–pixel alignment technique, which encodes sub-pixel beamlet shifts and broadening into pixel-scale intensity differences on moderate-pitch detectors. We present three configurations that utilize the same hardware: the established single-mask DPC arrangement and two new configurations, DF-only and combined DF–DPC. The desired configuration is selectable by a simple positional adjustment of the mask. We also developed a unified light-transport model that describes signal formation across each of the three configurations and enables accurate single-shot retrieval. Benefiting from the mask-pixel alignment technique and the physics model, our approach eliminates the need for ultra-fine detector resolution as well as mechanical stepping with multiple exposures, thus offering a fast, compact, low-cost, low-dose, and reconfigurable path to advanced multi-contrast X-ray imaging for clinical and industrial applications. These features would also make dark-field and differential phase computed tomography significantly more practical and clinically translatable.