Emergence of pseudoresonance in high-intensity resonant inelastic x-ray scattering

We report resonant inelastic x-ray scattering (RIXS) spectra of neon atoms interacting with intense x-ray pulses generated using an x-ray free-electron laser (XFEL). We find that an unexpected peak emerges near the <a:math xmlns:a="http://www.w3.org/1998/Math/MathML"> <a:mrow> <a:mi>K</a:mi> <a:mi>α</a:mi> </a:mrow> </a:math> line of Ne, which does not coincide with any physical resonances of neon ions. We perform theoretical calculations based on a quantum-state-resolved rate-equation approach with x-ray-induced processes including possible resonant excitations. Our dynamics simulations demonstrate that a sequence of multiple resonant photoabsorption events are involved and the interplay of those multiple resonances in combination with the relatively large spectral bandwidth of XFEL radiation leads to the emergent resonance-like structure at a position where no resonances exist. Our finding offers critical guidance for future applications of high-intensity RIXS at XFEL facilities.

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Journal
Physical review. A/Physical review, A
Published
2025-11-07
DOI
https://doi.org/10.1103/drmh-vmgk
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Emergence of pseudoresonance in high-intensity resonant inelastic x-ray scattering

John D. Bozek, Sebastian Cardoch, Moto Togawa, Marcus Agåker et al.
Physical review. A/Physical review, A
Advanced X-ray Imaging Techniques
article

Emergence of pseudoresonance in high-intensity resonant inelastic x-ray scattering

John D. Bozek, Sebastian Cardoch, Moto Togawa, Marcus Agåker, Hans Jakob Wörner, Philipp Schmidt, Sang-Kil Son, Johan Söderström, R. Püttner, M. Simon, Nicuşor Tı̂mneanu, Gilles Doumy, Robin Santra, Zhong Yin, Terry Mullins, Nils Rennhack, Linda Young, Yevheniy Ovcharenko, Iyas Ismail, Thomas Pfeifer, Björn Senfftleben, Sergey Usenko, M. N. Piancaśtelli, Lucas M. Cornetta, Hans Ågren, Johan Gråsjö, Carl Caleman, Emiliano De Santis, Ludvig Kjellsson, Th. Baumann, Nina Rohringer, C. Sánchez-Hanke, Conny Såthe, U. Eichmann, A. De Fanis, Xiaochun Gong, Jan‐Erik Rubensson, Sonia Coriani, Jacob Pedersen, Alice E. Green, J. Montaño, Christian Ott, Simon Dold, Eva Lindroth, Weiqing Xu, Laura Budewig, Olle Björneholm, J. Nordgren, Rebecca Boll, Michael Meyer, Kai Li, K. Ueda, Tommaso Mazza
article en

Abstract

We report resonant inelastic x-ray scattering (RIXS) spectra of neon atoms interacting with intense x-ray pulses generated using an x-ray free-electron laser (XFEL). We find that an unexpected peak emerges near the <a:math xmlns:a="http://www.w3.org/1998/Math/MathML"> <a:mrow> <a:mi>K</a:mi> <a:mi>α</a:mi> </a:mrow> </a:math> line of Ne, which does not coincide with any physical resonances of neon ions. We perform theoretical calculations based on a quantum-state-resolved rate-equation approach with x-ray-induced processes including possible resonant excitations. Our dynamics simulations demonstrate that a sequence of multiple resonant photoabsorption events are involved and the interplay of those multiple resonances in combination with the relatively large spectral bandwidth of XFEL radiation leads to the emergent resonance-like structure at a position where no resonances exist. Our finding offers critical guidance for future applications of high-intensity RIXS at XFEL facilities.

Physical review. A/Physical review, AVol. 112(5)
University of Rome Tor Vergata (IT), Uppsala University (SE), Argonne National Laboratory (US), SRI International (US), Universität Hamburg (DE), Stockholm University (SE), Universidade de São Paulo (BR), Lund University (SE), Tohoku University (JP), Norwegian University of Science and Technology (NO), Synchrotron soleil (FR), Deutsches Elektronen-Synchrotron DESY (DE), Diamond Light Source (GB), ShanghaiTech University (CN), ETH Zurich (CH), University of Chicago (US), MAX IV Laboratory (SE), Max-Born-Institute for Nonlinear Optics and Short Pulse Spectroscopy (DE), Laboratoire de Chimie Physique - Matière et Rayonnement (FR), Center for Free-Electron Laser Science (DE), Max Planck Institute for Nuclear Physics (DE), Freie Universität Berlin (DE), Zhejiang University (CN), European X-Ray Free-Electron Laser (DE), Technical University of Denmark (DK), University of Edinburgh (GB)
U.S. Department of Energy, European Commission, Deutsche Forschungsgemeinschaft, Stiftelsen för Strategisk Forskning, National Natural Science Foundation of China, Novo Nordisk, Vetenskapsrådet, Centre National de la Recherche Scientifique, Danmarks Tekniske Universitet, Uppsala Universitet, Novo Nordisk Fonden, Office of Science, Deutsches Elektronen-Synchrotron
Openalex Percentile: Top 57%
Advanced X-ray Imaging Techniques
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