Study of the linear distribution of absorption spectra at the Ta L3 edge in LiNb(1-x)TaxO3 crystals using X-ray beam spectral-spatial modulation using adaptive X-ray optical elements

Based on previously proposed approaches for implementing monochromatic X-ray beam rapid spectra modulation method using adaptive X-ray optical elements, a new spatially resolved technique has been developed. This technique was applied to record the tantalum L3 edge absorption spectra linear distribution with 37 µm spatial resolution. This method accelerates the sample's structure study rate by increasing the illuminated area compared to the classical X-ray absorption spectroscopy method and increasing the volume of information obtained relative to X-ray fluorescence. This approach is promising for studying crystalline materials with complex structure used in the microelectronics industry.

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Journal
Modern Electronic Materials
Published
2025-10-02
DOI
https://doi.org/10.3897/j.moem.11.3.150783
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

Study of the linear distribution of absorption spectra at the Ta L3 edge in LiNb(1-x)TaxO3 crystals using X-ray beam spectral-spatial modulation using adaptive X-ray optical elements

В. А. Коржов, А. И. Проценко, Yu. V. Pisarevsky, M. V. Kovalchuk et al.
Modern Electronic Materials
Advanced X-ray Imaging Techniques
article

Study of the linear distribution of absorption spectra at the Ta L3 edge in LiNb(1-x)TaxO3 crystals using X-ray beam spectral-spatial modulation using adaptive X-ray optical elements

В. А. Коржов, А. И. Проценко, Yu. V. Pisarevsky, M. V. Kovalchuk, Yan Eliovich
article en

Abstract

Based on previously proposed approaches for implementing monochromatic X-ray beam rapid spectra modulation method using adaptive X-ray optical elements, a new spatially resolved technique has been developed. This technique was applied to record the tantalum L3 edge absorption spectra linear distribution with 37 µm spatial resolution. This method accelerates the sample's structure study rate by increasing the illuminated area compared to the classical X-ray absorption spectroscopy method and increasing the volume of information obtained relative to X-ray fluorescence. This approach is promising for studying crystalline materials with complex structure used in the microelectronics industry.

Modern Electronic MaterialsVol. 11(3)
Kurchatov Institute (RU), A.V. Shubnikov Institute of Crystallography (RU)
Ministry of Science and Higher Education of the Russian Federation
Openalex Percentile: Top 57%
Advanced X-ray Imaging Techniques
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