Deep-learning-enabled single-shot fringe projection profilometry based on inner shifting-phase encoding
Single-shot fringe projection profilometry (FPP) offers significant advantages for dynamic three-dimensional (3D) measurement. However, existing deep learning-based single-shot methods still struggle to simultaneously and accurately extract the wrapped phase and fringe order. Because the former is a continuous physical quantity while the latter is a discrete integer label, their joint estimation from a single periodic pattern is inherently ambiguous, especially for isolated objects lacking spatial continuity. To address this problem, a deep learning-enabled single-shot FPP method is proposed by integrating inner shifting-phase encoding with a physically constrained dual-network architecture. The fringe order is embedded into the phase-shifting component of a single high-frequency fringe pattern, and two lightweight convolutional neural networks are then employed: one regresses the numerator and denominator of the wrapped phase, while the other classifies the inner shifting-phase value to recover the fringe order. This physically consistent decoupled design avoids the optimization conflicts of end-to-end regression and enables unambiguous absolute phase recovery. Experiments show that the proposed method could achieve high-accuracy absolute phase recovery comparable to traditional multi-frame techniques for measurements of complex and isolated objects, while maintaining low computational complexity. The dynamic experimental results demonstrate its application potential for dynamic 3D measurement.
Authors
- Jinlong Li (ORCID: https://orcid.org/0000-0001-7013-1477)
- Guojun Liu (ORCID: https://orcid.org/0000-0002-4363-8368)
- Yingying Wan
- Zhijie Wang (ORCID: https://orcid.org/0000-0002-3216-8620)
- Kuo Zhang (ORCID: https://orcid.org/0000-0002-4210-6941)
- Lin Luo (ORCID: https://orcid.org/0000-0003-1986-3853)
- Tao Tang (ORCID: https://orcid.org/0000-0003-0626-8190)
Publication Details
- Journal
- Optics Express
- Published
- 2025-11-07
- DOI
- https://doi.org/10.1364/oe.576136
- Citations
- 2
- Primary Topic
- Optical measurement and interference techniques
- Type
- article
- Field-Weighted Citation Impact
- 2.55