Deep-learning-enabled single-shot fringe projection profilometry based on inner shifting-phase encoding

Single-shot fringe projection profilometry (FPP) offers significant advantages for dynamic three-dimensional (3D) measurement. However, existing deep learning-based single-shot methods still struggle to simultaneously and accurately extract the wrapped phase and fringe order. Because the former is a continuous physical quantity while the latter is a discrete integer label, their joint estimation from a single periodic pattern is inherently ambiguous, especially for isolated objects lacking spatial continuity. To address this problem, a deep learning-enabled single-shot FPP method is proposed by integrating inner shifting-phase encoding with a physically constrained dual-network architecture. The fringe order is embedded into the phase-shifting component of a single high-frequency fringe pattern, and two lightweight convolutional neural networks are then employed: one regresses the numerator and denominator of the wrapped phase, while the other classifies the inner shifting-phase value to recover the fringe order. This physically consistent decoupled design avoids the optimization conflicts of end-to-end regression and enables unambiguous absolute phase recovery. Experiments show that the proposed method could achieve high-accuracy absolute phase recovery comparable to traditional multi-frame techniques for measurements of complex and isolated objects, while maintaining low computational complexity. The dynamic experimental results demonstrate its application potential for dynamic 3D measurement.

Authors

Publication Details

Journal
Optics Express
Published
2025-11-07
DOI
https://doi.org/10.1364/oe.576136
Citations
2
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
2.55
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article

Deep-learning-enabled single-shot fringe projection profilometry based on inner shifting-phase encoding

Jinlong Li, Guojun Liu, Yingying Wan, Zhijie Wang et al.
2 citations
Optics Express
Optical measurement and interference techniques
2.55
article

Deep-learning-enabled single-shot fringe projection profilometry based on inner shifting-phase encoding

Jinlong Li, Guojun Liu, Yingying Wan, Zhijie Wang, Kuo Zhang, Lin Luo, Tao Tang
article en
2 citations

Abstract

Single-shot fringe projection profilometry (FPP) offers significant advantages for dynamic three-dimensional (3D) measurement. However, existing deep learning-based single-shot methods still struggle to simultaneously and accurately extract the wrapped phase and fringe order. Because the former is a continuous physical quantity while the latter is a discrete integer label, their joint estimation from a single periodic pattern is inherently ambiguous, especially for isolated objects lacking spatial continuity. To address this problem, a deep learning-enabled single-shot FPP method is proposed by integrating inner shifting-phase encoding with a physically constrained dual-network architecture. The fringe order is embedded into the phase-shifting component of a single high-frequency fringe pattern, and two lightweight convolutional neural networks are then employed: one regresses the numerator and denominator of the wrapped phase, while the other classifies the inner shifting-phase value to recover the fringe order. This physically consistent decoupled design avoids the optimization conflicts of end-to-end regression and enables unambiguous absolute phase recovery. Experiments show that the proposed method could achieve high-accuracy absolute phase recovery comparable to traditional multi-frame techniques for measurements of complex and isolated objects, while maintaining low computational complexity. The dynamic experimental results demonstrate its application potential for dynamic 3D measurement.

Optics ExpressVol. 33(23)
Openalex Percentile: Top 8%
Optical measurement and interference techniques
2.55
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Deep-learning-enabled single-shot fringe projection profilometry based on inner shifting-phase encoding — Jinlong Li, Guojun Liu, et al. · Optics Express (2025) | TGRS Research Map | TGRS