A New Method of Phase-Contrast Microscopy of Microobjects Using a Nanofocusing Lens in Synchrotron Radiation

The first results obtained by a new experimental method for phase-contrast microscopy of microobjects using synchrotron radiation and a nanofocusing lens in a cone-beam geometry are presented. In the experiment, a secondary radiation source is formed in the lens focus located at a small distance from the microobject, enabling the acquisition of its magnified image. Under the near-field regime, the microobject structure can relatively easily be determined from the experimental image using the transport of intensity equation. The experiment was performed at the KISI-Kurchatov synchrotron radiation source. A model weakly absorbing microobject—commercially available carbon fiber of grade VMN-4—was used. The obtained fiber dimensions and structural features, resolved with submicron spatial resolution, are consistent with the electron microscopy data.

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Publication Details

Journal
Crystallography Reports
Published
2025-10-01
DOI
https://doi.org/10.1134/s1063774525601200
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

A New Method of Phase-Contrast Microscopy of Microobjects Using a Nanofocusing Lens in Synchrotron Radiation

П. А. Просеков, M. S. Folomeshkin, M. V. Kovalchuk, А. Е. Благов et al.
Crystallography Reports
Advanced X-ray Imaging Techniques
article

A New Method of Phase-Contrast Microscopy of Microobjects Using a Nanofocusing Lens in Synchrotron Radiation

П. А. Просеков, M. S. Folomeshkin, M. V. Kovalchuk, А. Е. Благов, Yu. V. Pisarevsky, A. Yu. Seregin, А. В. Александров, A. Snigirev, V. G. Kohn, Yu. A. Volkovsky, V. Yunkin
article en

Abstract

The first results obtained by a new experimental method for phase-contrast microscopy of microobjects using synchrotron radiation and a nanofocusing lens in a cone-beam geometry are presented. In the experiment, a secondary radiation source is formed in the lens focus located at a small distance from the microobject, enabling the acquisition of its magnified image. Under the near-field regime, the microobject structure can relatively easily be determined from the experimental image using the transport of intensity equation. The experiment was performed at the KISI-Kurchatov synchrotron radiation source. A model weakly absorbing microobject—commercially available carbon fiber of grade VMN-4—was used. The obtained fiber dimensions and structural features, resolved with submicron spatial resolution, are consistent with the electron microscopy data.

Crystallography ReportsVol. 70(5)
Immanuel Kant Baltic Federal University (RU), Kurchatov Institute (RU), Institute of Microelectronics Technology and High Purity Materials (RU)
Openalex Percentile: Top 57%
Advanced X-ray Imaging Techniques
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