A New Method of Phase-Contrast Microscopy of Microobjects Using a Nanofocusing Lens in Synchrotron Radiation
The first results obtained by a new experimental method for phase-contrast microscopy of microobjects using synchrotron radiation and a nanofocusing lens in a cone-beam geometry are presented. In the experiment, a secondary radiation source is formed in the lens focus located at a small distance from the microobject, enabling the acquisition of its magnified image. Under the near-field regime, the microobject structure can relatively easily be determined from the experimental image using the transport of intensity equation. The experiment was performed at the KISI-Kurchatov synchrotron radiation source. A model weakly absorbing microobject—commercially available carbon fiber of grade VMN-4—was used. The obtained fiber dimensions and structural features, resolved with submicron spatial resolution, are consistent with the electron microscopy data.
Authors
- П. А. Просеков
- M. S. Folomeshkin (ORCID: https://orcid.org/0000-0002-9799-7024)
- M. V. Kovalchuk
- А. Е. Благов (ORCID: https://orcid.org/0000-0003-2664-5686)
- Yu. V. Pisarevsky (ORCID: https://orcid.org/0000-0003-0013-0019)
- A. Yu. Seregin (ORCID: https://orcid.org/0000-0002-3599-053X)
- А. В. Александров (ORCID: https://orcid.org/0000-0002-0686-4067)
- A. Snigirev (ORCID: https://orcid.org/0000-0002-8892-1925)
- V. G. Kohn (ORCID: https://orcid.org/0000-0003-4332-9896)
- Yu. A. Volkovsky
- V. Yunkin
Institutions
- Immanuel Kant Baltic Federal University (RU)
- Kurchatov Institute (RU)
- Institute of Microelectronics Technology and High Purity Materials (RU)
Publication Details
- Journal
- Crystallography Reports
- Published
- 2025-10-01
- DOI
- https://doi.org/10.1134/s1063774525601200
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00