Hybrid Convolutional Neural Network–Bidirectional Long Short-Term Memory Model with Whale Optimization Algorithm for Error Prediction in On-Machine Measurement
On-machine measurement (OMM) enables real-time dimensional feedback in production, yet accuracy is often degraded by thermal drift, sensor noise, and environmental disturbances. This motivates intelligent error-prediction methods to ensure reliable, high-precision machining. This study proposes a hybrid deep learning model integrating a Convolutional Neural Network (CNN), a Bidirectional Long Short-Term Memory (Bi-LSTM) network, and a Whale Optimization Algorithm (WOA) for precise OMM error prediction. Initially, raw measurement data underwent preprocessing to remove noise and outliers. Subsequently, we use a CNN to extract features and a Bi-LSTM to model time-dependent patterns. Finally, WOA optimizes model hyperparameters globally, further boosting predictive accuracy. Comparative experiments show that the proposed model reduces RMSE, MAE, and MAPE by approximately 53.58%, 54.96%, and 57.65%, respectively, while improving the R2 score by about 11.17% over baseline methods. Results confirm the method’s superior nonlinear prediction capabilities, significantly enhancing machining accuracy and production efficiency, and demonstrating promising industrial application potential.
Authors
- Xu Xin (ORCID: https://orcid.org/0000-0001-6143-6471)
- Ziyan Zhu (ORCID: https://orcid.org/0009-0008-1243-0426)
- Ying Xiang (ORCID: https://orcid.org/0000-0003-1427-4814)
- Feng Xiong (ORCID: https://orcid.org/0000-0002-8711-7548)
- Chaoyi Dong (ORCID: https://orcid.org/0000-0001-8433-8903)
- Hu Qiao (ORCID: https://orcid.org/0000-0001-6233-4653)
Institutions
- Xi'an Technological University (CN)
- Shaanxi University of Science and Technology (CN)
- University of Birmingham (GB)
Publication Details
- Journal
- Processes
- Published
- 2025-11-05
- DOI
- https://doi.org/10.3390/pr13113568
- Primary Topic
- Advanced Measurement and Metrology Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00