Versatile infrared characterization platform: emissivity for opaque materials and emissivity-transmissivity-driven reflectivity for semi-transparent materials

Existing systems are limited to opaque or semi-transparent materials, impeding comparative analysis under identical conditions. To address this limitation, we present a versatile infrared characterization platform for measuring the emissivity of opaque materials and simultaneously determining the emissivity, transmissivity, and reflectivity of semi-transparent ones. This system integrates an FTIR spectrometer with a dual-blackbody optical path, a motorized switching mirror for rapid alternation, and a dual-door transparent furnace with a collimated optical system to accurately separate emitted and transmitted radiation from semi-transparent samples. Validation with silicon carbide (SiC), alumina (Al₂O₃), and zinc selenide (ZnSe) demonstrates excellent agreement with reported literature data, confirming accuracy and versatility. This approach overcomes persistent challenges in thermal radiation measurement, providing a robust tool to develop advanced thermal management and infrared stealth materials.