SiPM Characterization Based on Signal Temporal Distribution Extraction With Event-Refreshed TDC

This paper presents an efficient method for measuring multiple performance parameters of single-photon detectors (SPDs), based on the extraction of signal temporal distribution using an event-refreshed time-to-digital converter (ER-TDC). The working principle of an ER-TDC is to continue timing until being refreshed by a detected event. Attenuator P2 P3 Optical power meter Integrating sphere P1 SiPM Broadband LNA High speed comparator Optical paths It is implemented by a coarse and fine counting combined architecture, with on-chip statistics. The ER-TDC is utilized to record the probability distribution of the arrival time of the SPD outputs, which spread across multiple trigger periods. Based upon Poisson process, by fitting the periodic light-induced histogram peaks and dark counts distribution, the average detected photons, dark count rate (DCR) and dead time of the SPD can be accurately determined with one measurement. Performance tests of the TDC and experimental validation of the extraction method are implemented by using a commercial silicon photomultiplier (SiPM), in a time-saving and cost-effective manner.