Microwave Surface Resistance of Tl-1223 Films in a DC Magnetic Field

We present first preliminary surface impedance measurements on Tl-1223 films in dc magnetic fields, in view of potential applications for the next generation Future Circular Collider (FCC-hh) at CERN. The Tl-1223 samples were produced through laser ablation, with nominal thickness of 1<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$\mu$</tex-math></inline-formula>m and grown on a thick LaAlO<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$_{3}$</tex-math></inline-formula> substrate. The presence of Tl-1212 phase identified by XRD and BSE microscopy, could be avoided by changing the oxygen partial pressure during heat treatment. The high-frequency transport properties of the samples were characterized using microwave resonant devices, at fixed frequencies of 14.9 GHz, 24.2 GHz and 26.7 GHz, in the temperature range 40 K to 140 K. An external applied static magnetic field up to 12T was applied. Samples from subsequent batches exhibited huge improvements in the microwave properties, confirming the progress in the deposition technique.