Field-like torque measured via a Wheatstone bridge

In this study, a square Wheatstone bridge geometry is proposed to measure the field-like spin–orbit torque (FL-SOT) via second harmonic anisotropic magnetoresistance measurements. This design yields an enhanced signal over the conventional Hall bar due to a geometric enhancement. In addition, the square Wheatstone bridge allows for in situ calibration without the need for additional patterns. The FL-SOT coefficient is extracted from the square Wheatstone bridge patterned on a Py(=Fe80Ni20)/Pt bilayer. This extrapolated torque is then compared against an elongated Wheatstone bridge and a Hall bar to demonstrate efficacy in studying the field-like torque.

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Publication Details

Journal
Journal of Applied Physics
Published
2025-11-04
DOI
https://doi.org/10.1063/5.0300521
Primary Topic
Magnetic properties of thin films
Type
article
Field-Weighted Citation Impact
0.00

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article

Field-like torque measured via a Wheatstone bridge

Xin Fan, Kyle Peterson, David M. Plehn
Journal of Applied Physics
Magnetic properties of thin films
article

Field-like torque measured via a Wheatstone bridge

Xin Fan, Kyle Peterson, David M. Plehn
article en

Abstract

In this study, a square Wheatstone bridge geometry is proposed to measure the field-like spin–orbit torque (FL-SOT) via second harmonic anisotropic magnetoresistance measurements. This design yields an enhanced signal over the conventional Hall bar due to a geometric enhancement. In addition, the square Wheatstone bridge allows for in situ calibration without the need for additional patterns. The FL-SOT coefficient is extracted from the square Wheatstone bridge patterned on a Py(=Fe80Ni20)/Pt bilayer. This extrapolated torque is then compared against an elongated Wheatstone bridge and a Hall bar to demonstrate efficacy in studying the field-like torque.

Journal of Applied PhysicsVol. 138(17)
University of Denver (US), FirstPass Engineering (United States) (US)
National Science Foundation
Openalex Percentile: Top 74%
Magnetic properties of thin films
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