Fiber laser-assisted room-temperature crystallization of solution-processed indium-rich IGO thin films for high-performance, high-reliability thin-film transistors
Solution-processed nanocrystalline oxide semiconductors with fiber laser-assisted post-treatment enable next-generation displays and sensors, combining large-area uniformity, low-cost fabrication, and high electrical performance.
Authors
- Hanlim Kang
- Donghee Son (ORCID: https://orcid.org/0000-0002-3772-8009)
- Min Han (ORCID: https://orcid.org/0000-0003-1507-3985)
- Myung‐Gil Kim (ORCID: https://orcid.org/0000-0002-8607-5972)
- Choongik Kim (ORCID: https://orcid.org/0000-0001-7494-0677)
- Minki Son (ORCID: https://orcid.org/0009-0004-9712-468X)
- Minh Nhut Le
- Jae–Hyeok Cho
- Sujin Shin (ORCID: https://orcid.org/0000-0001-7981-2893)
- Ji‐Won Park (ORCID: https://orcid.org/0000-0003-4190-8165)
- In Soo Kim (ORCID: https://orcid.org/0000-0003-1615-3119)
- Bo-Ram Lee (ORCID: https://orcid.org/0009-0006-8349-5433)
- Minjun Kim (ORCID: https://orcid.org/0000-0002-3277-1710)
- Kyung-Hwan Min
- Woo-Jin Oh
- Van Thu Cao
Institutions
- Northwestern University (US)
- Georgia Institute of Technology (US)
- Sogang University (KR)
- Hyupsung University (KR)
- Sustainability Institute (ZA)
- Suwon Research Institute (KR)
- Institute for Basic Science (KR)
- Korea Institute of Science and Technology (KR)
- Sungkyunkwan University (KR)
Publication Details
- Journal
- Journal of Materials Chemistry C
- Published
- 2025-11-04
- DOI
- https://doi.org/10.1039/d5tc02983j
- Citations
- 1
- Primary Topic
- Thin-Film Transistor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.73