High-accuracy analyses of key minor and trace elements in zircon by electron probe microanalysis
A new EPMA method for determining minor and trace elements ( e.g. , Al, P, Ti, Y, Yb, Lu, Hf, Th, and U) in zircon was developed. It features low detection limits ( e.g. , Ti, 9 μg g −1 , 3 σ ), high spatial resolution (<3 μm), and high analytical accuracy.
Authors
- Lihui Jia (ORCID: https://orcid.org/0000-0002-4000-4183)
- Haijun Yu (ORCID: https://orcid.org/0000-0002-3398-0880)
- Hao Wang (ORCID: https://orcid.org/0000-0002-3269-652X)
- Qian Mao (ORCID: https://orcid.org/0000-0002-9065-5531)
- Haojie Chen (ORCID: https://orcid.org/0000-0002-4362-1056)
- Yi Chen (ORCID: https://orcid.org/0000-0001-6167-8032)
- Zeling Wang
Institutions
- Chinese Academy of Sciences (CN)
- China University of Geosciences (Beijing) (CN)
- Institute of Geology and Geophysics (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- Journal of Analytical Atomic Spectrometry
- Published
- 2025-11-03
- DOI
- https://doi.org/10.1039/d5ja00150a
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00