Theoretical predictions for ultrasensitive sensing in three-dimensional stochastic interferometry

We show that a random light field can be harnessed for high-precision metrology by introducing specific boundary conditions in the form of Lambertian reflections inside a cavity. We demonstrate a quantifiable and reproducible interferometric response to minute perturbations in wavelength, refractive index, and geometry, predicting high sensitivities consistent with experimental measurements of geometrical deformations down to the picometer scale.