Improvement of radiation hardness for a novel InP-based HEMT with graded In1-xGaxAs channel layer and double Si-doped structure

• A novel structure incorporating a graded In 1-x Ga x As channel layer and double Si-doped structure of InP-based HEMT (DPLC-HEMT) is proposed to enhance the radiation resistance. • After 75-keV irradiation with a proton dose of 2 × 10 12 cm −2 , the f T and f max of DPLC-HEMT are only decreased by 9.3% and 5.2%, while, the f T and f max of conventional InP-based HEMT (C-HEMT) are decreased by 26.2% and 21.2%, respectively. • Compared to the C-HEMT, the f T and f max for DPLC-HEMT reached to 460 GHz and 944 GHz, representing a 85.5% and 47.5% increase. The I sat and g max of the DPLC-HEMT has improved by 125.1% and 83.0% compared to the C-HEMT. To enhance the radiation resistance of the InP-based HEMT, a novel structure incorporating a graded In 1-x Ga x As channel layer and double Si-doped structure (DPLC-HEMT) is proposed. First, a deeper quantum well is formed due to the introduction of graded In 1-x Ga x As channel, that efficiently confines electrons within the quantum well, lead to the boosting of electron density in the channel. Second, the double Si-doped structure further boosts the electron density in the quantum well. The increase in native carriers reduces the effect of carrier removal caused by irradiation defects, thereby enhancing the radiation resistance of the DPLC-HEMT. The simulation results show that after 75-keV irradiation with a proton dose of 2 × 10 12 cm − 2 , the saturation drain current ( I sat ), peak transconductance ( g max ), f T and f max of DPLC-HEMT are decreased by 23%, 13.2%, 9.3% and 5.2%, respectively, while, the I sat , g m,max , f T and f max of conventional InP-based HEMT (C-HEMT) are decreased by 64%, 29.5%, 26.2% and 21.2%, respectively. It can be seen that DPLC-HEMT effectively enhances the anti-proton irradiation ability. Moreover, the DC and RF characteristics were also improved for the DPLC-HEMT. Compared to the C-HEMT, the peak value of the f T for DPLC-HEMT has increased from 248 GHz to 460 GHz, representing a 85.5% increase, the peak value of the f max for DPLC-HEMT has increased from 640 GHz to 944 GHz, representing a 47.5% increase. The I sat and g max of the DPLC-HEMT has improved by 125.1% and 83.0% compared to the C-HEMT.

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Publication Details

Journal
Results in Engineering
Published
2025-10-31
DOI
https://doi.org/10.1016/j.rineng.2025.108000
Primary Topic
Radiation Effects in Electronics
Type
article
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article

Improvement of radiation hardness for a novel InP-based HEMT with graded In1-xGaxAs channel layer and double Si-doped structure

Xiaorong Luo, Xintong Xie, Shuxiang Sun, J. Ajayan et al.
Results in Engineering
Radiation Effects in Electronics
article

Improvement of radiation hardness for a novel InP-based HEMT with graded In1-xGaxAs channel layer and double Si-doped structure

Xiaorong Luo, Xintong Xie, Shuxiang Sun, J. Ajayan, Hongying Mei
article en

Abstract

• A novel structure incorporating a graded In 1-x Ga x As channel layer and double Si-doped structure of InP-based HEMT (DPLC-HEMT) is proposed to enhance the radiation resistance. • After 75-keV irradiation with a proton dose of 2 × 10 12 cm −2 , the f T and f max of DPLC-HEMT are only decreased by 9.3% and 5.2%, while, the f T and f max of conventional InP-based HEMT (C-HEMT) are decreased by 26.2% and 21.2%, respectively. • Compared to the C-HEMT, the f T and f max for DPLC-HEMT reached to 460 GHz and 944 GHz, representing a 85.5% and 47.5% increase. The I sat and g max of the DPLC-HEMT has improved by 125.1% and 83.0% compared to the C-HEMT. To enhance the radiation resistance of the InP-based HEMT, a novel structure incorporating a graded In 1-x Ga x As channel layer and double Si-doped structure (DPLC-HEMT) is proposed. First, a deeper quantum well is formed due to the introduction of graded In 1-x Ga x As channel, that efficiently confines electrons within the quantum well, lead to the boosting of electron density in the channel. Second, the double Si-doped structure further boosts the electron density in the quantum well. The increase in native carriers reduces the effect of carrier removal caused by irradiation defects, thereby enhancing the radiation resistance of the DPLC-HEMT. The simulation results show that after 75-keV irradiation with a proton dose of 2 × 10 12 cm − 2 , the saturation drain current ( I sat ), peak transconductance ( g max ), f T and f max of DPLC-HEMT are decreased by 23%, 13.2%, 9.3% and 5.2%, respectively, while, the I sat , g m,max , f T and f max of conventional InP-based HEMT (C-HEMT) are decreased by 64%, 29.5%, 26.2% and 21.2%, respectively. It can be seen that DPLC-HEMT effectively enhances the anti-proton irradiation ability. Moreover, the DC and RF characteristics were also improved for the DPLC-HEMT. Compared to the C-HEMT, the peak value of the f T for DPLC-HEMT has increased from 248 GHz to 460 GHz, representing a 85.5% increase, the peak value of the f max for DPLC-HEMT has increased from 640 GHz to 944 GHz, representing a 47.5% increase. The I sat and g max of the DPLC-HEMT has improved by 125.1% and 83.0% compared to the C-HEMT.

Results in EngineeringVol. 28
University of Electronic Science and Technology of China (CN), National Engineering Research Center of Electromagnetic Radiation Control Materials (CN), Huanghuai University (CN)
Openalex Percentile: Top 68%
Radiation Effects in Electronics
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