A Novel Adaptive Testing Method Using Convolutional Neural Networks
In this work, we present a novel adaptive testing method based on convolutional neural networks (CNNs). We propose a conversion method of test patterns into spectral images using the fast Fourier transform (FFT), which enables consistent dimensionality across various circuits and allows the CNN to extract frequency-domain features. Moreover, we investigate the effect of different types of spectral images by comparing a single-channel magnitude image with a multi-channel image that includes magnitude, real, and imaginary parts. Experimental results on the ISCAS ’85 benchmark circuits show that the proposed method achieves over 95% accuracy with a maximum of 97% reduced parameters compared to MLP and conventional CNNs. Therefore, we demonstrate the effectiveness and scalability of the proposed method for adaptive testing.
Authors
- WanSoo Kim
- HyunJin Kim (ORCID: https://orcid.org/0000-0001-5017-3995)
- Dongkyu Shin (ORCID: https://orcid.org/0000-0003-4939-4023)
- S. B. Oh
Publication Details
- Journal
- JSTS Journal of Semiconductor Technology and Science
- Published
- 2025-10-30
- DOI
- https://doi.org/10.5573/jsts.2025.54.5.610
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00