A Novel Adaptive Testing Method Using Convolutional Neural Networks

In this work, we present a novel adaptive testing method based on convolutional neural networks (CNNs). We propose a conversion method of test patterns into spectral images using the fast Fourier transform (FFT), which enables consistent dimensionality across various circuits and allows the CNN to extract frequency-domain features. Moreover, we investigate the effect of different types of spectral images by comparing a single-channel magnitude image with a multi-channel image that includes magnitude, real, and imaginary parts. Experimental results on the ISCAS ’85 benchmark circuits show that the proposed method achieves over 95% accuracy with a maximum of 97% reduced parameters compared to MLP and conventional CNNs. Therefore, we demonstrate the effectiveness and scalability of the proposed method for adaptive testing.

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Publication Details

Journal
JSTS Journal of Semiconductor Technology and Science
Published
2025-10-30
DOI
https://doi.org/10.5573/jsts.2025.54.5.610
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

A Novel Adaptive Testing Method Using Convolutional Neural Networks

WanSoo Kim, HyunJin Kim, Dongkyu Shin, S. B. Oh
JSTS Journal of Semiconductor Technology and Science
VLSI and Analog Circuit Testing
article

A Novel Adaptive Testing Method Using Convolutional Neural Networks

WanSoo Kim, HyunJin Kim, Dongkyu Shin, S. B. Oh
article en

Abstract

In this work, we present a novel adaptive testing method based on convolutional neural networks (CNNs). We propose a conversion method of test patterns into spectral images using the fast Fourier transform (FFT), which enables consistent dimensionality across various circuits and allows the CNN to extract frequency-domain features. Moreover, we investigate the effect of different types of spectral images by comparing a single-channel magnitude image with a multi-channel image that includes magnitude, real, and imaginary parts. Experimental results on the ISCAS ’85 benchmark circuits show that the proposed method achieves over 95% accuracy with a maximum of 97% reduced parameters compared to MLP and conventional CNNs. Therefore, we demonstrate the effectiveness and scalability of the proposed method for adaptive testing.

JSTS Journal of Semiconductor Technology and ScienceVol. 25(5)
Openalex Percentile: Top 66%
VLSI and Analog Circuit Testing
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A Novel Adaptive Testing Method Using Convolutional Neural Networks — WanSoo Kim, HyunJin Kim, et al. · JSTS Journal of Semiconductor Technology and Science (2025) | TGRS Research Map | TGRS