Revealing the structural complexity of ETS-10 using 4D-STEM & electron ptychography

Atomic-level structural elucidation of zeolites remains challenging, particularly due to their sensitivity to the electron beam, as in the case of ETS-10, which features a unique 12-membered ring titanosilicate framework with linear Ti–O–Ti chains. In this study, we demonstrate the use of four-dimensional scanning transmission electron microscopy (4D-STEM) combined with electron ptychography to image Eu-exchanged ETS-10 (Eu-ETS-10) at sub-angstrom resolution. A homemade ptychographic reconstruction algorithm based on the extended ptychographical iterative engine (ePIE) was developed, enabling recovery of high-fidelity phase contrast images. The reconstructed images reveal not only all T-sites, including Si and Ti atoms, but also light elements such as oxygen and extraframework Eu 3+ cations. Surface terminations and stacking faults were clearly resolved, allowing identification of the ABA and ABC polymorphs and their local transformations along the three dimensions through multislice reconstruction. These results validate ptychography as a powerful technique for atomic-scale analysis of fragile zeolitic materials offering unique insights into the structural complexity of ETS-10. • The structure of ETS-10 has been investigated. • Sub-angstrom resolution has been accomplished via electron ptychography • The three-dimensional structure have been elucidated • Surface termination can be accurately identified.

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Publication Details

Journal
Microporous and Mesoporous Materials
Published
2025-10-30
DOI
https://doi.org/10.1016/j.micromeso.2025.113913
Citations
1
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
1.88

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article

Revealing the structural complexity of ETS-10 using 4D-STEM & electron ptychography

Santiago Cóbreces, Álvaro Mayoral, Dong Li, Zhuoya Dong et al.
1 citations
Microporous and Mesoporous Materials
Advanced X-ray Imaging Techniques
1.88
article

Revealing the structural complexity of ETS-10 using 4D-STEM & electron ptychography

Santiago Cóbreces, Álvaro Mayoral, Dong Li, Zhuoya Dong, Qing Zhang, Sara Kayani, Daniel Pizarro
article en
1 citations

Abstract

Atomic-level structural elucidation of zeolites remains challenging, particularly due to their sensitivity to the electron beam, as in the case of ETS-10, which features a unique 12-membered ring titanosilicate framework with linear Ti–O–Ti chains. In this study, we demonstrate the use of four-dimensional scanning transmission electron microscopy (4D-STEM) combined with electron ptychography to image Eu-exchanged ETS-10 (Eu-ETS-10) at sub-angstrom resolution. A homemade ptychographic reconstruction algorithm based on the extended ptychographical iterative engine (ePIE) was developed, enabling recovery of high-fidelity phase contrast images. The reconstructed images reveal not only all T-sites, including Si and Ti atoms, but also light elements such as oxygen and extraframework Eu 3+ cations. Surface terminations and stacking faults were clearly resolved, allowing identification of the ABA and ABC polymorphs and their local transformations along the three dimensions through multislice reconstruction. These results validate ptychography as a powerful technique for atomic-scale analysis of fragile zeolitic materials offering unique insights into the structural complexity of ETS-10. • The structure of ETS-10 has been investigated. • Sub-angstrom resolution has been accomplished via electron ptychography • The three-dimensional structure have been elucidated • Surface termination can be accurately identified.

Microporous and Mesoporous MaterialsVol. 400
European Union (BE), Universidad de Alcalá (ES), ShanghaiTech University (CN), Instituto de Nanociencia y Materiales de Aragón (ES)
Ministerio de Ciencia, Innovación y Universidades, European Commission, Gobierno de Aragón, ShanghaiTech University, Consejo Superior de Investigaciones Científicas, Agencia Estatal de Investigación, School of Physical Science and Technology, ShanghaiTech University
Openalex Percentile: Top 12%
Advanced X-ray Imaging Techniques
1.88
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