Pathway to >60% Efficiency in AlGaN‐Based Ultraviolet‐C Light‐Emitting Diodes

Ray‐tracing simulations of ultraviolet‐C light‐emitting diodes (UVC LEDs) reveal that the primary limitation in light extraction efficiency (LEE) is the absorption in the LED layers, contacts, and substrate—not the high refractive index of AlGaN, as is commonly suspected. The research demonstrates a significant improvement in LEE with the removal of the p‐GaN contact layer and the use of highly reflective UVC contact metallization, far surpassing the efficiency gains achievable through typically applied surface modifications alone. Multiple internal reflections raise the probability of photon escape. The model agrees well with measurements from representative UVC LEDs and suggests routes to achieve LEE >60%.

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Publication Details

Journal
physica status solidi (a)
Published
2025-10-28
DOI
https://doi.org/10.1002/pssa.202500520
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.00

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article

Pathway to >60% Efficiency in AlGaN‐Based Ultraviolet‐C Light‐Emitting Diodes

Pramod Reddy, Ronny Kirste, Baxter Moody, Zlatko Sitar et al.
physica status solidi (a)
GaN-based semiconductor devices and materials
article

Pathway to >60% Efficiency in AlGaN‐Based Ultraviolet‐C Light‐Emitting Diodes

Pramod Reddy, Ronny Kirste, Baxter Moody, Zlatko Sitar, Shashwat Rathkanthiwar, Ramón Collazo, Jack Almeter, James Loveless
article en

Abstract

Ray‐tracing simulations of ultraviolet‐C light‐emitting diodes (UVC LEDs) reveal that the primary limitation in light extraction efficiency (LEE) is the absorption in the LED layers, contacts, and substrate—not the high refractive index of AlGaN, as is commonly suspected. The research demonstrates a significant improvement in LEE with the removal of the p‐GaN contact layer and the use of highly reflective UVC contact metallization, far surpassing the efficiency gains achievable through typically applied surface modifications alone. Multiple internal reflections raise the probability of photon escape. The model agrees well with measurements from representative UVC LEDs and suggests routes to achieve LEE >60%.

physica status solidi (a)Vol. 222(24)
North Carolina State University (US), Adroit Materials (United States) (US)
National Science Foundation, Division of Electrical, Communications and Cyber Systems, Army Research Office
Openalex Percentile: Top 80%
GaN-based semiconductor devices and materials
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