Design, Fabrication, and Characterization of a Layered Si/Ag/AgCl/KCl Planar Solid-State Reference Electrode
In this article, a novel configuration of a planar solid-state Si/Ag/AgCl/KCl reference electrode was designed and fabricated using different deposition techniques (screen-printing, chronoamperometry, and microdropping). The planar reference electrode was configured in a rectangular form, measuring 40 by 10 mm, through a layer-by-layer assembly process. The electrochemical performance and characteristics of the fabricated reference electrode were tested and compared to those of a commercially saturated Ag/AgCl reference electrode. The open-circuit potential of the fabricated electrode, compared to the commercial one, exhibits excellent stability in various KCl concentrations, reaching an ideal stable and constant value of approximately 0 V in a 3 M KCl solution. Additionally, the potential of the fabricated reference electrode remained stable for 15 days and was unaffected by pH variations. Cyclic voltammetry tests conducted in solutions containing K3[Fe(CN)6] and K4[Fe(CN)6] indicated that the electrochemical behavior of the fabricated electrode was similar to that of the commercial references.
Authors
- Yassine Haddad
- A. Keffous
- Chafiaa Yaddadene
- Nadia Chekir (ORCID: https://orcid.org/0000-0002-7833-3679)
- Sidi Mohammed Merah (ORCID: https://orcid.org/0000-0003-2444-7993)
- Yamna Bakha (ORCID: https://orcid.org/0000-0001-5590-6983)
- Djilali Tassalit (ORCID: https://orcid.org/0000-0003-0745-1376)
- Z. Málek
Institutions
- University of Sciences and Technology Houari Boumediene (DZ)
- Centre de Développement des Technologies Avancées (DZ)
- Renewable Energy Development Center (DZ)
- Centre de Recherche en Technologie des Semi-conducteurs pour l’Energétique (DZ)
Publication Details
- Journal
- Russian Journal of Physical Chemistry A
- Published
- 2025-10-28
- DOI
- https://doi.org/10.1134/s0036024425601375
- Primary Topic
- Copper Interconnects and Reliability
- Type
- article
- Field-Weighted Citation Impact
- 0.00