Optimization of Tungsten Anode Target Design for High-Energy Microfocus X-Ray Sources via Geant4 Monte Carlo Simulation

High-energy microfocus X-ray sources are increasingly applied in non-destructive testing, high-resolution imaging, and additive manufacturing. The design and optimization of the anode target critically determine source efficiency, spectral characteristics, and imaging performance. In this study, Monte Carlo simulations using the Geant4 toolkit were conducted to systematically evaluate transmission and reflection tungsten targets with varied thicknesses and incidence angles under electron beam energies ranging from 100 to 300 keV. The results reveal that, for a microfocus X-ray source operating at a maximum tube voltage of 225 kV, the optimal transmission tungsten target exhibits a thickness of 18 μm, whereas the optimal reflection tungsten target achieves maximum efficiency at a 30 μm thickness with a 25° incidence angle. A nearly linear relationship between electron energy and optimal transmission target thickness is established within the 100–300 keV range. Additionally, the influence of beryllium window thickness and filter materials on the emergent X-ray spectrum is analyzed, demonstrating pathways for spectral hardening and transmission optimization. This study further elucidates the angular–intensity distribution of emitted X-rays, providing critical insights into beam spatial characteristics. Collectively, these findings establish a theoretical foundation for target optimization, enabling enhanced X-ray source performance in high-resolution imaging and supporting applications in detector calibration, flatness correction, beam hardening correction, and radiation shielding design.

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Publication Details

Journal
Photonics
Published
2025-10-27
DOI
https://doi.org/10.3390/photonics12111062
Primary Topic
Advanced X-ray and CT Imaging
Type
article
Field-Weighted Citation Impact
0.00

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article

Optimization of Tungsten Anode Target Design for High-Energy Microfocus X-Ray Sources via Geant4 Monte Carlo Simulation

Zhengkun Fu, Yiheng Liu, Jinshou Tian, Duan Luo et al.
Photonics
Advanced X-ray and CT Imaging
article

Optimization of Tungsten Anode Target Design for High-Energy Microfocus X-Ray Sources via Geant4 Monte Carlo Simulation

Zhengkun Fu, Yiheng Liu, Jinshou Tian, Duan Luo, Yuetian Liu, Wei Zhao, Lili Li, Xue Zhang, Liwei Xin
article en

Abstract

High-energy microfocus X-ray sources are increasingly applied in non-destructive testing, high-resolution imaging, and additive manufacturing. The design and optimization of the anode target critically determine source efficiency, spectral characteristics, and imaging performance. In this study, Monte Carlo simulations using the Geant4 toolkit were conducted to systematically evaluate transmission and reflection tungsten targets with varied thicknesses and incidence angles under electron beam energies ranging from 100 to 300 keV. The results reveal that, for a microfocus X-ray source operating at a maximum tube voltage of 225 kV, the optimal transmission tungsten target exhibits a thickness of 18 μm, whereas the optimal reflection tungsten target achieves maximum efficiency at a 30 μm thickness with a 25° incidence angle. A nearly linear relationship between electron energy and optimal transmission target thickness is established within the 100–300 keV range. Additionally, the influence of beryllium window thickness and filter materials on the emergent X-ray spectrum is analyzed, demonstrating pathways for spectral hardening and transmission optimization. This study further elucidates the angular–intensity distribution of emitted X-rays, providing critical insights into beam spatial characteristics. Collectively, these findings establish a theoretical foundation for target optimization, enabling enhanced X-ray source performance in high-resolution imaging and supporting applications in detector calibration, flatness correction, beam hardening correction, and radiation shielding design.

PhotonicsVol. 12(11)
Xi'an Institute of Optics and Precision Mechanics (CN), Shaanxi Normal University (CN)
Chinese Academy of Sciences, Natural Science Foundation of Shaanxi Province, Xi'an Institute of Optics and Precision Mechanics, National Key Research and Development Program of China
Openalex Percentile: Top 70%
Advanced X-ray and CT Imaging
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