Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments

Electron spectroscopy implemented in electron microscopes provides high spatial resolution, down to the atomic scale, of the chemical, electronic, vibrational and optical properties of materials. In this review, we will describe how temporal coincidence experiments in the nanosecond to femtosecond range between different electron spectroscopies involving photons, inelastic electrons and secondary electrons can provide information bits not accessible to independent spectroscopies. In particular, we will focus on nano-optics applications. The instrumental modifications necessary for these experiments are discussed, as well as the perspectives for these coincidence techniques.

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Publication Details

Journal
Microscopy
Published
2025-10-23
DOI
https://doi.org/10.1093/jmicro/dfaf047
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.00
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article

Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments

Luiz H. G. Tizei, Yves Auad, Mathieu Kociak, Florian Castioni
Microscopy
Advanced Electron Microscopy Techniques and Applications
article

Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments

Luiz H. G. Tizei, Yves Auad, Mathieu Kociak, Florian Castioni
article en

Abstract

Electron spectroscopy implemented in electron microscopes provides high spatial resolution, down to the atomic scale, of the chemical, electronic, vibrational and optical properties of materials. In this review, we will describe how temporal coincidence experiments in the nanosecond to femtosecond range between different electron spectroscopies involving photons, inelastic electrons and secondary electrons can provide information bits not accessible to independent spectroscopies. In particular, we will focus on nano-optics applications. The instrumental modifications necessary for these experiments are discussed, as well as the perspectives for these coincidence techniques.

Microscopy
Centre National de la Recherche Scientifique (FR), Université Paris-Saclay (FR), Laboratoire de physique des Solides (FR)
Openalex Percentile: Top 86%
Advanced Electron Microscopy Techniques and Applications
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