Effects of the substrate thickness and chip area on the light extraction efficiency of chip-scale liquid cup encapsulated AlGaN-based deep-ultraviolet light-emitting diodes

The low light extraction efficiency (LEE) of AlGaN-based deep ultraviolet light-emitting diodes (DUV LEDs) has hindered the explosive growth of the application market. In this study, theoretical calculations reveal that the fluorinated liquid encapsulation can significantly alleviate the total internal reflection (TIR) at both the surface and sidewalls of DUV LED chips. Among various liquid encapsulation schemes, the chip-scale liquid cup shows the largest enhancement in the LEE of DUV LEDs because the inclined sidewall of the liquid cup can redirect light towards the center of the quartz hemisphere. Furthermore, the LEE of DUV LEDs increases with the increased sapphire substrate thickness and the decreased chip area. The trend is attributed to fewer internal reflections and less light absorption before photons reach the chip sidewalls. With the optimized chip encapsulation strategy, a maximum wall-plug efficiency (WPE) of 15% at 2 mA and a fitted LEE of 18.38% were obtained at an emission wavelength of 275 nm.

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Publication Details

Journal
Optics Express
Published
2025-10-28
DOI
https://doi.org/10.1364/oe.579872
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
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article

Effects of the substrate thickness and chip area on the light extraction efficiency of chip-scale liquid cup encapsulated AlGaN-based deep-ultraviolet light-emitting diodes

Yanan Guo, Jianchang Yan, Naixin Liu, Linbo Hao et al.
Optics Express
GaN-based semiconductor devices and materials
article

Effects of the substrate thickness and chip area on the light extraction efficiency of chip-scale liquid cup encapsulated AlGaN-based deep-ultraviolet light-emitting diodes

Yanan Guo, Jianchang Yan, Naixin Liu, Linbo Hao, Yonghui Zhang, JianYong LI, Shen Wang, Xiaojun Jia, Dongfang Su, Zi‐Hui Zhang, Tong Zhang, Xuecheng Wei, Xuejiao Sun, Junxi Wang
article en

Abstract

The low light extraction efficiency (LEE) of AlGaN-based deep ultraviolet light-emitting diodes (DUV LEDs) has hindered the explosive growth of the application market. In this study, theoretical calculations reveal that the fluorinated liquid encapsulation can significantly alleviate the total internal reflection (TIR) at both the surface and sidewalls of DUV LED chips. Among various liquid encapsulation schemes, the chip-scale liquid cup shows the largest enhancement in the LEE of DUV LEDs because the inclined sidewall of the liquid cup can redirect light towards the center of the quartz hemisphere. Furthermore, the LEE of DUV LEDs increases with the increased sapphire substrate thickness and the decreased chip area. The trend is attributed to fewer internal reflections and less light absorption before photons reach the chip sidewalls. With the optimized chip encapsulation strategy, a maximum wall-plug efficiency (WPE) of 15% at 2 mA and a fitted LEE of 18.38% were obtained at an emission wavelength of 275 nm.

Optics ExpressVol. 33(23)
North University of China (CN), Hebei University of Technology (CN), Shanxi University of Traditional Chinese Medicine (CN), Institute of Semiconductors (CN), University of Chinese Academy of Sciences (CN)
Openalex Percentile: Top 80%
GaN-based semiconductor devices and materials
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