Purity-Based Axial Distance Calibration for Ptychography
We present an axial calibration method based on probe purity in mixed-state ptychography. It outperforms sharpness-based approaches in generalizability, offering high-fidelity imaging and robust reconstruction across complex and weakly scattering samples.
Authors
- Jan Rothhardt (ORCID: https://orcid.org/0000-0002-8007-3327)
- Wilhelm Eschen (ORCID: https://orcid.org/0000-0003-3821-3987)
- Chang Liu (ORCID: https://orcid.org/0000-0001-6314-5424)
- D. S. Penagos Molina
- L. Licht
- Mahmoud Abdelaal
Institutions
- Helmholtz Institute Jena (DE)
- GSI Helmholtz Centre for Heavy Ion Research (DE)
- Fraunhofer Institute for Applied Optics and Precision Engineering (DE)
- Friedrich Schiller University Jena (DE)
Publication Details
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1364/cosi.2025.jm4b.5
- Primary Topic
- Advanced X-ray Imaging Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00