High-order diffraction gratings with an isosceles triangle profile for a nano-precision linear optical encoder
High-order diffraction is preferred to nanoscale displacement measurement by linear optical encoder. The diffraction efficiency at high orders, however, is limited. In this Letter, a high-order diffraction grating with an isosceles triangle profile in cross-section is proposed, and it could achieve over 40% in the diffraction efficiency of the ±4th order. Fabricated by anisotropic etching of Si (100) and followed by replication, the grating period is 4.82 μm and the symmetrical side angle for diffraction is 46.1°. Experiments indicate that, by the interference of ±4th order (optical subdivision is 8 times), the positioning accuracy in 1 mm travel length is 37.1 nm, the repeatability is 3.7 nm, and the stability is 3.6 nm @ 60 s, which are measured by the standard deviation (<i>σ</i>).
Authors
- Xunhan Wang (ORCID: https://orcid.org/0009-0005-9635-6654)
- Li Tian (ORCID: https://orcid.org/0000-0001-6461-6072)
- Bangdao Chen (ORCID: https://orcid.org/0000-0003-3225-4286)
- Shu‐Wei Ren (ORCID: https://orcid.org/0000-0002-9156-2927)
- Hongzhong Liu (ORCID: https://orcid.org/0000-0001-6875-3509)
- Weitao Jiang (ORCID: https://orcid.org/0000-0002-9222-2844)
- Jingzhi Su (ORCID: https://orcid.org/0000-0002-3629-6443)
- Guojun Li (ORCID: https://orcid.org/0000-0002-0658-7047)
- Yongsheng Shi
- Dong Niu (ORCID: https://orcid.org/0000-0001-6181-0996)
- Lei Yin (ORCID: https://orcid.org/0000-0002-7083-6466)
Institutions
- Physical Measurement Laboratory (US)
- National Measurement Laboratory (AU)
- Xi'an Jiaotong University (CN)
Publication Details
- Journal
- Optics Letters
- Published
- 2025-10-27
- DOI
- https://doi.org/10.1364/ol.571870
- Primary Topic
- Advanced Measurement and Metrology Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00