Multi-mode discharge behaviour induced by charged micron-nano dust and photonic characterization
This study investigates the unique multi-mode discharge mechanisms induced by charged micron-nano dust in high-voltage systems, which exhibit distinct dynamic, electromagnetic, and statistical characteristics compared to larger particles. Existing detection technologie fail to capture the attenuated, highly concealed signals from micron-nano dust-induced weak discharges, hindering mechanistic understanding. To address this gap, we develop a novel ultraviolet-visible-infrared (UV-VIS-IR) multi-spectral detection platform using silicon photomultiplier (SiPM) tube arrays with high-transmittance bandpass filters. Experiments analyze dispersed micron-nano dust discharges preceding surface flashovers and air-gap breakdowns. Surface flashovers require micron-nano dust speckle formation and contour deepening, reducing system breakdown voltage by up to 71%. Dust arrangement critically influences flashover voltage. Discharge spectral intensity inversely correlates with particle size and increases with dust mass, with VIS (350-600 nm) being dominant. The work elucidates fundamental mechanisms of micron-nano dust-induced penetrating discharges, providing a foundation for advanced detection and mitigation strategies.
Authors
- 隆則 尾関
- L.M. Cheng (ORCID: https://orcid.org/0000-0001-5501-8441)
- Zhenguo Ji (ORCID: https://orcid.org/0000-0002-9405-9403)
- Cheng Ding (ORCID: https://orcid.org/0000-0002-7244-3535)
- Naifan Xue (ORCID: https://orcid.org/0000-0002-7672-3681)
- Chenhao Mo (ORCID: https://orcid.org/0000-0003-3286-0526)
- Huayu Li (ORCID: https://orcid.org/0000-0001-6917-1666)
- Yan Ding (ORCID: https://orcid.org/0000-0003-1779-6837)
- Menghua Deng
- Shaowei Xue
Institutions
- Shanghai Electric (China) (CN)
Publication Details
- Journal
- IET conference proceedings.
- Published
- 2025-10-01
- DOI
- https://doi.org/10.1049/icp.2025.3160
- Primary Topic
- Ocular and Laser Science Research
- Type
- article
- Field-Weighted Citation Impact
- 0.00