Multi-mode discharge behaviour induced by charged micron-nano dust and photonic characterization

This study investigates the unique multi-mode discharge mechanisms induced by charged micron-nano dust in high-voltage systems, which exhibit distinct dynamic, electromagnetic, and statistical characteristics compared to larger particles. Existing detection technologie fail to capture the attenuated, highly concealed signals from micron-nano dust-induced weak discharges, hindering mechanistic understanding. To address this gap, we develop a novel ultraviolet-visible-infrared (UV-VIS-IR) multi-spectral detection platform using silicon photomultiplier (SiPM) tube arrays with high-transmittance bandpass filters. Experiments analyze dispersed micron-nano dust discharges preceding surface flashovers and air-gap breakdowns. Surface flashovers require micron-nano dust speckle formation and contour deepening, reducing system breakdown voltage by up to 71%. Dust arrangement critically influences flashover voltage. Discharge spectral intensity inversely correlates with particle size and increases with dust mass, with VIS (350-600 nm) being dominant. The work elucidates fundamental mechanisms of micron-nano dust-induced penetrating discharges, providing a foundation for advanced detection and mitigation strategies.

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Publication Details

Journal
IET conference proceedings.
Published
2025-10-01
DOI
https://doi.org/10.1049/icp.2025.3160
Primary Topic
Ocular and Laser Science Research
Type
article
Field-Weighted Citation Impact
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article

Multi-mode discharge behaviour induced by charged micron-nano dust and photonic characterization

隆則 尾関, L.M. Cheng, Zhenguo Ji, Cheng Ding et al.
IET conference proceedings.
Ocular and Laser Science Research
article

Multi-mode discharge behaviour induced by charged micron-nano dust and photonic characterization

隆則 尾関, L.M. Cheng, Zhenguo Ji, Cheng Ding, Naifan Xue, Chenhao Mo, Huayu Li, Yan Ding, Menghua Deng, Shaowei Xue
article en

Abstract

This study investigates the unique multi-mode discharge mechanisms induced by charged micron-nano dust in high-voltage systems, which exhibit distinct dynamic, electromagnetic, and statistical characteristics compared to larger particles. Existing detection technologie fail to capture the attenuated, highly concealed signals from micron-nano dust-induced weak discharges, hindering mechanistic understanding. To address this gap, we develop a novel ultraviolet-visible-infrared (UV-VIS-IR) multi-spectral detection platform using silicon photomultiplier (SiPM) tube arrays with high-transmittance bandpass filters. Experiments analyze dispersed micron-nano dust discharges preceding surface flashovers and air-gap breakdowns. Surface flashovers require micron-nano dust speckle formation and contour deepening, reducing system breakdown voltage by up to 71%. Dust arrangement critically influences flashover voltage. Discharge spectral intensity inversely correlates with particle size and increases with dust mass, with VIS (350-600 nm) being dominant. The work elucidates fundamental mechanisms of micron-nano dust-induced penetrating discharges, providing a foundation for advanced detection and mitigation strategies.

IET conference proceedings.Vol. 2025(26)
Shanghai Electric (China) (CN)
Openalex Percentile: Top 56%
Ocular and Laser Science Research
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