Dielectric Properties of Co-Doped TiO2 with Mg and Nb for Energy Storage Applications
Titanium dioxide is attractive for energy storage due to its abundance, stability, non-toxicity, low cost, and favorable electronic/optical properties. Colossal permittivity (CP) in co-doped TiO<sub>2</sub> is mainly linked to defect structures rather than intrinsic bulk behavior. This work studies the dielectric properties of TiO<sub>2</sub> co-doped with niobium and magnesium, synthesized by solid-state reaction. Grain size effects were examined by varying ball milling parameters of (½Mg½Nb)<sub>0.05</sub>Ti<sub>0.95</sub>O<sub>2</sub> and then were correlated with structure, morphology, and dielectric response. X-ray diffraction (XRD), infrared spectroscopy (FTIR), scanning electron microscopy and energy-dispersive X-ray spectroscopy (SEM-EDS), X-ray photoelectron spectroscopy (XPS), and impedance spectroscopy (IS) (40 Hz-10<sup>6</sup> Hz, 150-370 K) were employed for structural, morphological, and electrical characterization. XRD confirmed the rutile phase. For co-doped samples, larger grains yielded higher dielectric constants, reaching high permittivity (<i>ε</i>' = 429, <i>T</i> = 300 K, <i>f</i> = 10 kHz at 500 rpm for 2 h). Lower loss tangent (tan <i>δ</i> = 0.11, <i>T</i> = 300 K, <i>f</i> = 10 kHz at 200 rpm for 2 h) is linked to Mg segregation at grain boundaries. The most conductive sample showed the highest dielectric constant, suggesting an IBLC polarization mechanism driven by grain boundary effects. XPS confirmed Nb and Mg incorporation, with Ti<sup>4+</sup> dominant and minor Ti<sup>3+</sup> from oxygen vacancies and surface hydroxylation/defects.
Authors
- Sílvia Rodrigues Gavinho (ORCID: https://orcid.org/0000-0001-6216-3735)
- Ratiba Benzerga (ORCID: https://orcid.org/0000-0002-5755-0041)
- F. Amaral (ORCID: https://orcid.org/0000-0002-1697-290X)
- S. Soreto Teixeira (ORCID: https://orcid.org/0000-0003-4084-5764)
- G. Socol (ORCID: https://orcid.org/0000-0002-1992-7346)
- Luís Cadillon Costa (ORCID: https://orcid.org/0000-0001-7666-4741)
- Luiza Izabela Toderascu (ORCID: https://orcid.org/0000-0001-6789-2515)
- João Carvalho (ORCID: https://orcid.org/0000-0003-2416-9081)
- L. Ferchaud
Institutions
- Polytechnic Institute of Coimbra (PT)
- National Institute for Laser Plasma and Radiation Physics (RO)
- Institut d'Électronique et des Technologies du numéRique (FR)
- Centre Hospitalier de Saint-Brieuc (FR)
- University of Aveiro (PT)
Publication Details
- Journal
- Nanomaterials
- Published
- 2025-10-26
- DOI
- https://doi.org/10.3390/nano15211632
- Citations
- 1
- Primary Topic
- Dielectric properties of ceramics
- Type
- article
- Field-Weighted Citation Impact
- 0.52