Bethe ridge electron Compton spectroscopy

Compton spectroscopy measures J(p<sub>z</sub>), the number density of occupied electronic states with momentum component p<sub>z</sub>. In a transmission electron microscope (TEM) Compton spectroscopy is performed by acquiring a momentum resolved, dark-field electron energy loss spectrum (EELS). Here it is shown that the Bethe ridge in a single energy filtered diffraction pattern can provide identical J(p<sub>z</sub>) information. The energy filtered TEM (EFTEM) approach is more dose efficient, since all (projected) momenta p<sub>z</sub> are recorded in parallel. For weakly diffracting specimens, the J(p<sub>z</sub>) profiles extracted using EFTEM are in reasonable agreement with dark-field EELS. Bragg diffraction and thermal diffuse scattering are known to introduce artefacts in Compton spectroscopy, and this is true for the EFTEM method as well. The artefacts can however be mitigated by analysing suitably thin specimens.

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Publication Details

Journal
Ultramicroscopy
Published
2025-10-26
DOI
https://doi.org/10.1016/j.ultramic.2025.114264
Primary Topic
Radioactive element chemistry and processing
Type
article
Field-Weighted Citation Impact
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article

Bethe ridge electron Compton spectroscopy

C. F. Williamson, S. H. Hayes, Budhika G. Mendis, Stewart J. Clark et al.
Ultramicroscopy
Radioactive element chemistry and processing
article

Bethe ridge electron Compton spectroscopy

C. F. Williamson, S. H. Hayes, Budhika G. Mendis, Stewart J. Clark, K Dhamotharan
article en

Abstract

Compton spectroscopy measures J(p<sub>z</sub>), the number density of occupied electronic states with momentum component p<sub>z</sub>. In a transmission electron microscope (TEM) Compton spectroscopy is performed by acquiring a momentum resolved, dark-field electron energy loss spectrum (EELS). Here it is shown that the Bethe ridge in a single energy filtered diffraction pattern can provide identical J(p<sub>z</sub>) information. The energy filtered TEM (EFTEM) approach is more dose efficient, since all (projected) momenta p<sub>z</sub> are recorded in parallel. For weakly diffracting specimens, the J(p<sub>z</sub>) profiles extracted using EFTEM are in reasonable agreement with dark-field EELS. Bragg diffraction and thermal diffuse scattering are known to introduce artefacts in Compton spectroscopy, and this is true for the EFTEM method as well. The artefacts can however be mitigated by analysing suitably thin specimens.

UltramicroscopyVol. 280
Durham University (GB)
Openalex Percentile: Top 74%
Radioactive element chemistry and processing
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