Apparatus for the measurement of birefringence maps of optical materials: the case of crystalline silicon for Einstein Telescope

Abstract Einstein Telescope (ET) is expected to achieve sensitivity improvements exceeding an order of magnitude compared to current gravitational-wave detectors. The rigorous characterization in optical birefringence of materials and coatings has become a critical task for next-generation detectors, especially since this birefringence is generally spatially non-uniform. A highly sensitive optical polarimeter has been developed at the Department of Physics and Earth Sciences of the University of Ferrara and INFN - Ferrara Section, Italy, aimed at performing two-dimensional birefringence mapping of substrates. In this paper we describe the design and working principle of the system and present results for crystalline silicon, a candidate material for substrates in the low-frequency interferometers of ET. We find that the birefringence is $$\lesssim 10^{-7}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mo>≲</mml:mo> <mml:msup> <mml:mn>10</mml:mn> <mml:mrow> <mml:mo>-</mml:mo> <mml:mn>7</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> for commercially available samples and is position dependent in the silicon (100)-oriented samples, with variations in both magnitude and axis orientation. We also measure the intrinsic birefringence of the (110) surface: $$\Delta n^{(110)}=-(1.50\pm 0.15)\times 10^{-6}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mi>Δ</mml:mi> <mml:msup> <mml:mi>n</mml:mi> <mml:mrow> <mml:mo>(</mml:mo> <mml:mn>110</mml:mn> <mml:mo>)</mml:mo> </mml:mrow> </mml:msup> <mml:mo>=</mml:mo> <mml:mo>-</mml:mo> <mml:mrow> <mml:mo>(</mml:mo> <mml:mn>1.50</mml:mn> <mml:mo>±</mml:mo> <mml:mn>0.15</mml:mn> <mml:mo>)</mml:mo> </mml:mrow> <mml:mo>×</mml:mo> <mml:msup> <mml:mn>10</mml:mn> <mml:mrow> <mml:mo>-</mml:mo> <mml:mn>6</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> @ $$\lambda =1550$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mi>λ</mml:mi> <mml:mo>=</mml:mo> <mml:mn>1550</mml:mn> </mml:mrow> </mml:math> nm. Implications for the performance of gravitational-wave interferometers are discussed.

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Journal
Applied Physics B
Published
2025-10-25
DOI
https://doi.org/10.1007/s00340-025-08554-4
Primary Topic
Calibration and Measurement Techniques
Type
article
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0.00

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article

Apparatus for the measurement of birefringence maps of optical materials: the case of crystalline silicon for Einstein Telescope

Aurélie Max Mailliet, A. Mazzolari, Alina Mariana Soflau, Giovanni Di Domenico et al.
Applied Physics B
Calibration and Measurement Techniques
article

Apparatus for the measurement of birefringence maps of optical materials: the case of crystalline silicon for Einstein Telescope

Aurélie Max Mailliet, A. Mazzolari, Alina Mariana Soflau, Giovanni Di Domenico, F. Della Valle, G. Zavattini, Lorenzo Malagutti, E. Mariotti, Marco Romagnoni, Francesco Cescato
article en

Abstract

Abstract Einstein Telescope (ET) is expected to achieve sensitivity improvements exceeding an order of magnitude compared to current gravitational-wave detectors. The rigorous characterization in optical birefringence of materials and coatings has become a critical task for next-generation detectors, especially since this birefringence is generally spatially non-uniform. A highly sensitive optical polarimeter has been developed at the Department of Physics and Earth Sciences of the University of Ferrara and INFN - Ferrara Section, Italy, aimed at performing two-dimensional birefringence mapping of substrates. In this paper we describe the design and working principle of the system and present results for crystalline silicon, a candidate material for substrates in the low-frequency interferometers of ET. We find that the birefringence is $$\lesssim 10^{-7}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mo>≲</mml:mo> <mml:msup> <mml:mn>10</mml:mn> <mml:mrow> <mml:mo>-</mml:mo> <mml:mn>7</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> for commercially available samples and is position dependent in the silicon (100)-oriented samples, with variations in both magnitude and axis orientation. We also measure the intrinsic birefringence of the (110) surface: $$\Delta n^{(110)}=-(1.50\pm 0.15)\times 10^{-6}$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mi>Δ</mml:mi> <mml:msup> <mml:mi>n</mml:mi> <mml:mrow> <mml:mo>(</mml:mo> <mml:mn>110</mml:mn> <mml:mo>)</mml:mo> </mml:mrow> </mml:msup> <mml:mo>=</mml:mo> <mml:mo>-</mml:mo> <mml:mrow> <mml:mo>(</mml:mo> <mml:mn>1.50</mml:mn> <mml:mo>±</mml:mo> <mml:mn>0.15</mml:mn> <mml:mo>)</mml:mo> </mml:mrow> <mml:mo>×</mml:mo> <mml:msup> <mml:mn>10</mml:mn> <mml:mrow> <mml:mo>-</mml:mo> <mml:mn>6</mml:mn> </mml:mrow> </mml:msup> </mml:mrow> </mml:math> @ $$\lambda =1550$$ <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"> <mml:mrow> <mml:mi>λ</mml:mi> <mml:mo>=</mml:mo> <mml:mn>1550</mml:mn> </mml:mrow> </mml:math> nm. Implications for the performance of gravitational-wave interferometers are discussed.

Applied Physics BVol. 131(11)
University of Siena (IT), University of Ferrara (IT), Istituto Nazionale di Fisica Nucleare, Sezione di Ferrara (IT), Istituto Nazionale di Fisica Nucleare, Sezione di Pisa (IT)
European Commission, Università degli Studi di Ferrara
Openalex Percentile: Top 58%
Calibration and Measurement Techniques
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